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Mikhailik, O. M., Yelsukov, E. P., Konygin, G. N., Mikhailova, S. S., Povstugar, V. I. (1998) Transmission Mössbauer spectroscopy study of the surface of iron powders: feasibility and results. Surface and Interface Analysis, 26 (12). 885-888 doi:10.1002/(sici)1096-9918(199811)26:12<885::aid-sia430>3.0.co;2-8

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Reference TypeJournal (article/letter/editorial)
TitleTransmission Mössbauer spectroscopy study of the surface of iron powders: feasibility and results
JournalSurface and Interface Analysis
AuthorsMikhailik, O. M.Author
Yelsukov, E. P.Author
Konygin, G. N.Author
Mikhailova, S. S.Author
Povstugar, V. I.Author
Year1998 (November)Volume26
Issue12
PublisherWiley
DOIdoi:10.1002/(sici)1096-9918(199811)26:12<885::aid-sia430>3.0.co;2-8Search in ResearchGate
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Mindat Ref. ID6506004Long-form Identifiermindat:1:5:6506004:1
GUID0
Full ReferenceMikhailik, O. M., Yelsukov, E. P., Konygin, G. N., Mikhailova, S. S., Povstugar, V. I. (1998) Transmission Mössbauer spectroscopy study of the surface of iron powders: feasibility and results. Surface and Interface Analysis, 26 (12). 885-888 doi:10.1002/(sici)1096-9918(199811)26:12<885::aid-sia430>3.0.co;2-8
Plain TextMikhailik, O. M., Yelsukov, E. P., Konygin, G. N., Mikhailova, S. S., Povstugar, V. I. (1998) Transmission Mössbauer spectroscopy study of the surface of iron powders: feasibility and results. Surface and Interface Analysis, 26 (12). 885-888 doi:10.1002/(sici)1096-9918(199811)26:123.0.co;2-8
In(1998, November) Surface and Interface Analysis Vol. 26 (12) Wiley

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Seah, M. P., Gilmore, I. S. (1998) Quantitative AES. VIII: analysis of auger electron intensities from elemental data in a digital auger database. Surface and Interface Analysis, 26 (12). 908-929 doi:10.1002/(sici)1096-9918(199811)26:12<908::aid-sia438>3.0.co;2-h
Bideux, L., Robert, C., Merle, S., Gruzza, B., Goumet, E., Gil-Lafon, E. (1998) Some applications of elastic peak electron spectroscopy for semiconductor surface studies. Surface and Interface Analysis, 26 (12). 903-907 doi:10.1002/(sici)1096-9918(199811)26:12<903::aid-sia436>3.0.co;2-1
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Pan, J. S., Tay, S. T., Huan, C. H. A., Wee, A. T. S. (1998) Atomic force microscopy investigation of the O2+-induced surface topography of InP. Surface and Interface Analysis, 26 (12). 930-938 doi:10.1002/(sici)1096-9918(199811)26:12<930::aid-sia440>3.0.co;2-o
Kaltsas, G., Glezos, N., Valamontes, E., Nassiopoulou, A. G. (1998) Thickness determination of thin films based onx-ray signal decay law. Surface and Interface Analysis, 26 (12). 876-884 doi:10.1002/(sici)1096-9918(199811)26:12<876::aid-sia429>3.0.co;2-h
Briggs, David (1998) Book Review: Handbook of Surface and Interface Analysis-Methods for Problem Solving Marcel Dekker, New York, 1998; xxv+968 pp., $225. Surface and Interface Analysis, 26 (12). 958-959 doi:10.1002/(sici)1096-9918(199811)26:12<958::aid-sia475>3.0.co;2-h
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