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Castle, J. E., Salvi, A. M., Guascito, M. R. (2001) Analysis of the x-ray photoelectron energy-loss background in silicides. Surface and Interface Analysis, 31 (9). 881-889 doi:10.1002/sia.1124

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of the x-ray photoelectron energy-loss background in silicides
JournalSurface and Interface Analysis
AuthorsCastle, J. E.Author
Salvi, A. M.Author
Guascito, M. R.Author
Year2001 (September)Volume31
Issue9
PublisherWiley
DOIdoi:10.1002/sia.1124Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6507545Long-form Identifiermindat:1:5:6507545:0
GUID0
Full ReferenceCastle, J. E., Salvi, A. M., Guascito, M. R. (2001) Analysis of the x-ray photoelectron energy-loss background in silicides. Surface and Interface Analysis, 31 (9). 881-889 doi:10.1002/sia.1124
Plain TextCastle, J. E., Salvi, A. M., Guascito, M. R. (2001) Analysis of the x-ray photoelectron energy-loss background in silicides. Surface and Interface Analysis, 31 (9). 881-889 doi:10.1002/sia.1124
In(2001, September) Surface and Interface Analysis Vol. 31 (9) Wiley

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Castle, J. E., Guascito, M. R., Salvi, A. M., Decker, F. (2002) An electrochemical cell for study by XPS of lithium intercalation in oxide films. Surface and Interface Analysis, 34 (1). 619-622 doi:10.1002/sia.1373
Castle, J. E., Salvi, A. M., Guascito, M. R. (1999) Substrate-related feature in the loss structure of contamination C 1s. Surface and Interface Analysis, 27 (8). 753-760 doi:10.1002/(sici)1096-9918(199908)27:8<753::aid-sia569>3.0.co;2-k
Seah, M. P. (2001) Summary of ISO/TC 201 Standard: VII ISO 15472 : 2001?surface chemical analysis?x-ray photoelectron spectrometers?calibration of energy scales. Surface and Interface Analysis, 31 (8). 721-723 doi:10.1002/sia.1076
Castle, J. E., Greaves, S. J., Guascito, M. R., Salvi, A. M. (2000) An X-ray photoelectron study of valence charge in transition metal aluminides. Philosophical Magazine A, 80 (10). 2425-2444 doi:10.1080/01418610008216482
Moretti, G., Salvi, A. M., Guascito, M. R., Langerame, F. (2004) An XPS study of microporous and mesoporous titanosilicates. Surface and Interface Analysis, 36 (10). 1402-1412 doi:10.1002/sia.1931
Jenkins, S. N., Castle, J. E. (1994) Development and practical application of a transmission x-ray photoelectron spectrometer. Surface and Interface Analysis, 21 (6). 382-386 doi:10.1002/sia.740210610
Kurth, M., Graat, P. C. J. (2002) Quantitative analysis of the plasmon loss intensities in x-ray photoelectron spectra of magnesium. Surface and Interface Analysis, 34 (1). 220-224 doi:10.1002/sia.1287
Jenkins, S. N., Castle, J. E. (1993) Preliminary results from the development of a transmission x-ray photoelectron spectrometer. Surface and Interface Analysis, 20 (12). 935-940 doi:10.1002/sia.740201202
Carbone, M. E., Ciriello, R., Salvi, A. M., Castle, J. E. (2016) ToF-SIMS study of stages in the electrochemical growth of insulating poly(o-aminophenol) films. Surface and Interface Analysis, 48 (7). 644-648 doi:10.1002/sia.5968
Castle, J. E. (1984) Practical surface analysis by Auger and X-ray photoelectron spectroscopy. D. Briggs and M. P. Seah (Editors). John Wiley and Sons Ltd, Chichester, 1983, 533 pp., £44.50. Surface and Interface Analysis, 6 (6). 302 doi:10.1002/sia.740060611
Castle, J. E., Castle, M. D. (1983) Simultaneous XRF and XPS analysis. Surface and Interface Analysis, 5 (5). 193-198 doi:10.1002/sia.740050505
 
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