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Jiang, W., Shutthanandan, V., Thevuthasan, S., Wang, C. M., Weber, W. J. (2005) Nitrogen analysis using energetic ion beams. Surface and Interface Analysis, 37 (4). 374-378 doi:10.1002/sia.1991

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Reference TypeJournal (article/letter/editorial)
TitleNitrogen analysis using energetic ion beams
JournalSurface and Interface Analysis
AuthorsJiang, W.Author
Shutthanandan, V.Author
Thevuthasan, S.Author
Wang, C. M.Author
Weber, W. J.Author
Year2005 (April)Volume37
Issue4
PublisherWiley
DOIdoi:10.1002/sia.1991Search in ResearchGate
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Mindat Ref. ID6509674Long-form Identifiermindat:1:5:6509674:5
GUID0
Full ReferenceJiang, W., Shutthanandan, V., Thevuthasan, S., Wang, C. M., Weber, W. J. (2005) Nitrogen analysis using energetic ion beams. Surface and Interface Analysis, 37 (4). 374-378 doi:10.1002/sia.1991
Plain TextJiang, W., Shutthanandan, V., Thevuthasan, S., Wang, C. M., Weber, W. J. (2005) Nitrogen analysis using energetic ion beams. Surface and Interface Analysis, 37 (4). 374-378 doi:10.1002/sia.1991
In(2005, April) Surface and Interface Analysis Vol. 37 (4) Wiley

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Jiang, W, Shutthanandan, V, Thevuthasan, S, McCready, D.E, Weber, W.J (2003) Oxygen analysis using energetic ion beams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 207 (4). 453-461 doi:10.1016/s0168-583x(03)01123-6
Jiang, W, Shutthanandan, V, Thevuthasan, S, McCready, D.E, Weber, W.J (2004) Carbon analysis using energetic ion beams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 222 (3). 538-546 doi:10.1016/j.nimb.2004.03.001
Jiang, W., Shutthanandan, V., Thevuthasan, S., McCready, D.E., Weber, W.J. (2005) Erratum to: “Carbon analysis using energetic ion beams” [Nucl. Instr. and Meth. B 222 (2004) 538–546]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 227 (3). 450-451 doi:10.1016/j.nimb.2004.10.083
Jiang, W., Weber, W. J., Thevuthasan, S., McCready, D. E. (1999) Rutherford backscattering spectrometry channeling study of ion-irradiated 6H-SiC. Surface and Interface Analysis, 27 (4). 179-184 doi:10.1002/(sici)1096-9918(199904)27:4<179::aid-sia459>3.0.co;2-1
Zhu, Zihua, Shutthanandan, Vaithiyalingam (2012) Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?. Surface and Interface Analysis, 44 (1). 89-93 doi:10.1002/sia.3776
Tokash, J. C., Stojilovic, N., Ramsier, R. D., Kovacik, M. W., Mostardi, R. A. (2005) Surface analysis of prosthetic wear debris. Surface and Interface Analysis, 37 (4). 379-384 doi:10.1002/sia.1993
Wang, C. M., Thevuthasan, S., Shutthanandan, V., Cavanagh, A., Jiang, W., Thomas, L. E., Weber, W. J. (2003) Microstructure of precipitated Au nanoclusters in MgO. Journal of Applied Physics, 93 (10). 6327-6333 doi:10.1063/1.1569032
Liang, J. H., Ruan, W. M. (2005) Characteristics of ion-beam-synthesized tantalum silicide film. Surface and Interface Analysis, 37 (2). 129-132 doi:10.1002/sia.1947
Thevuthasan, S., Shutthanandan, V., Wang, C.M., Weber, W.J., Jiang, W., Cavanagh, A., Lian, J., Wang, L.M. (2004) Ion-beam synthesis of epitaxial Au nanocrystals in MgO. Journal of Materials Research, 19 (5) 1311-1314 doi:10.1557/jmr.2004.0174
Jiang, W., Zhang, Y., Shutthanandan, V., Thevuthasan, S., Weber, W. J. (2006) Temperature response of C13 atoms in amorphized 6H–SiC. Applied Physics Letters, 89 (26). 261902pp. doi:10.1063/1.2422892
Wang, C. M., Zhang, Y., Shutthanandan, V., Baer, D. R., Weber, W. J., Thomas, L. E., Thevuthasan, S., Duscher, G. (2005) Self-assembling of nanocavities inTiO2dispersed with Au nanoclusters. Physical Review B, 72 (24) doi:10.1103/physrevb.72.245421
 
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