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Ramana, C. V., Smith, R. J., Hussain, O. M., Massot, M., Julien, C. M. (2005) Surface analysis of pulsed laser-deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy. Surface and Interface Analysis, 37 (4). 406-411 doi:10.1002/sia.2018

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Reference TypeJournal (article/letter/editorial)
TitleSurface analysis of pulsed laser-deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy
JournalSurface and Interface Analysis
AuthorsRamana, C. V.Author
Smith, R. J.Author
Hussain, O. M.Author
Massot, M.Author
Julien, C. M.Author
Year2005 (April)Volume37
Issue4
PublisherWiley
DOIdoi:10.1002/sia.2018Search in ResearchGate
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Mindat Ref. ID6509684Long-form Identifiermindat:1:5:6509684:2
GUID0
Full ReferenceRamana, C. V., Smith, R. J., Hussain, O. M., Massot, M., Julien, C. M. (2005) Surface analysis of pulsed laser-deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy. Surface and Interface Analysis, 37 (4). 406-411 doi:10.1002/sia.2018
Plain TextRamana, C. V., Smith, R. J., Hussain, O. M., Massot, M., Julien, C. M. (2005) Surface analysis of pulsed laser-deposited V2O5 thin films and their lithium intercalated products studied by Raman spectroscopy. Surface and Interface Analysis, 37 (4). 406-411 doi:10.1002/sia.2018
In(2005, April) Surface and Interface Analysis Vol. 37 (4) Wiley

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Alamarguy, D., Castle, J. E., Liberatore, M., Decker, F. (2006) Distribution of intercalated lithium in V2O5 thin films determined by SIMS depth profiling. Surface and Interface Analysis, 38 (4). 847-850 doi:10.1002/sia.2139
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