Reference Type | Journal (article/letter/editorial) |
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Title | Variation of the grand mean value of Si-O distances in metamorphic reactions |
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Journal | Chinese Science Bulletin |
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Authors | Ye, Danian | Author |
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Li, Zhe | Author |
He, Wei | Author |
Year | 2001 (April) | Volume | 46 |
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Issue | 8 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1007/bf03182841Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 7101467 | Long-form Identifier | mindat:1:5:7101467:2 |
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GUID | 0 |
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Full Reference | Ye, Danian, Li, Zhe, He, Wei (2001) Variation of the grand mean value of Si-O distances in metamorphic reactions. Chinese Science Bulletin, 46 (8). 702-704 doi:10.1007/bf03182841 |
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Plain Text | Ye, Danian, Li, Zhe, He, Wei (2001) Variation of the grand mean value of Si-O distances in metamorphic reactions. Chinese Science Bulletin, 46 (8). 702-704 doi:10.1007/bf03182841 |
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In | (2001, April) Chinese Science Bulletin Vol. 46 (8) Springer Science and Business Media LLC |
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