EKGASIT, Sanong, PATTAYAKORN, Narumon, TONGSAKUL, Duangta, THAMMACHAROEN, Chuchaat, KONGYOU, Tassimon (2007) A Novel ATR FT-IR Microspectroscopy Technique for Surface Contamination Analysis without Interference of the Substrate. Analytical Sciences, 23 (7). 863-868 doi:10.2116/analsci.23.863
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A Novel ATR FT-IR Microspectroscopy Technique for Surface Contamination Analysis without Interference of the Substrate | ||
Journal | Analytical Sciences | ||
Authors | EKGASIT, Sanong | Author | |
PATTAYAKORN, Narumon | Author | ||
TONGSAKUL, Duangta | Author | ||
THAMMACHAROEN, Chuchaat | Author | ||
KONGYOU, Tassimon | Author | ||
Year | 2007 | Volume | 23 |
Issue | 7 | ||
Publisher | Japan Society for Analytical Chemistry | ||
DOI | doi:10.2116/analsci.23.863Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7432870 | Long-form Identifier | mindat:1:5:7432870:7 |
GUID | 0 | ||
Full Reference | EKGASIT, Sanong, PATTAYAKORN, Narumon, TONGSAKUL, Duangta, THAMMACHAROEN, Chuchaat, KONGYOU, Tassimon (2007) A Novel ATR FT-IR Microspectroscopy Technique for Surface Contamination Analysis without Interference of the Substrate. Analytical Sciences, 23 (7). 863-868 doi:10.2116/analsci.23.863 | ||
Plain Text | EKGASIT, Sanong, PATTAYAKORN, Narumon, TONGSAKUL, Duangta, THAMMACHAROEN, Chuchaat, KONGYOU, Tassimon (2007) A Novel ATR FT-IR Microspectroscopy Technique for Surface Contamination Analysis without Interference of the Substrate. Analytical Sciences, 23 (7). 863-868 doi:10.2116/analsci.23.863 | ||
In | (2007) Analytical Sciences Vol. 23 (7) Japan Society for Analytical Chemistry |
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