Reference Type | Journal (article/letter/editorial) |
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Title | Low Cycle Fatigue Properties of Ni added Low Silver Content Sn-Ag-Cu Flip Chip Interconnects |
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Journal | MATERIALS TRANSACTIONS |
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Authors | Kariya, Yoshiharu | Author |
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Hosoi, Takuya | Author |
Kimura, Takashi | Author |
Terashima, Shinichi | Author |
Tanaka, Masamoto | Author |
Year | 2004 | Volume | 45 |
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Issue | 3 |
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Publisher | Japan Institute of Metals |
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DOI | doi:10.2320/matertrans.45.689Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 7777376 | Long-form Identifier | mindat:1:5:7777376:8 |
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GUID | 0 |
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Full Reference | Kariya, Yoshiharu, Hosoi, Takuya, Kimura, Takashi, Terashima, Shinichi, Tanaka, Masamoto (2004) Low Cycle Fatigue Properties of Ni added Low Silver Content Sn-Ag-Cu Flip Chip Interconnects. MATERIALS TRANSACTIONS, 45 (3). 689-694 doi:10.2320/matertrans.45.689 |
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Plain Text | Kariya, Yoshiharu, Hosoi, Takuya, Kimura, Takashi, Terashima, Shinichi, Tanaka, Masamoto (2004) Low Cycle Fatigue Properties of Ni added Low Silver Content Sn-Ag-Cu Flip Chip Interconnects. MATERIALS TRANSACTIONS, 45 (3). 689-694 doi:10.2320/matertrans.45.689 |
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In | (2004) MATERIALS TRANSACTIONS Vol. 45 (3) Japan Institute of Metals |
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