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Muto, Shunsuke, Enomoto, Naruaki (2005) Substructures of Gas-Ion-Irradiation-Induced Surface Blisters in Silicon Studied by Cross-Sectional Transmission Electron Microscopy. MATERIALS TRANSACTIONS, 46 (10). 2117-2124 doi:10.2320/matertrans.46.2117

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Reference TypeJournal (article/letter/editorial)
TitleSubstructures of Gas-Ion-Irradiation-Induced Surface Blisters in Silicon Studied by Cross-Sectional Transmission Electron Microscopy
JournalMATERIALS TRANSACTIONS
AuthorsMuto, ShunsukeAuthor
Enomoto, NaruakiAuthor
Year2005Volume46
Issue10
PublisherJapan Institute of Metals
DOIdoi:10.2320/matertrans.46.2117Search in ResearchGate
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Mindat Ref. ID7777800Long-form Identifiermindat:1:5:7777800:0
GUID0
Full ReferenceMuto, Shunsuke, Enomoto, Naruaki (2005) Substructures of Gas-Ion-Irradiation-Induced Surface Blisters in Silicon Studied by Cross-Sectional Transmission Electron Microscopy. MATERIALS TRANSACTIONS, 46 (10). 2117-2124 doi:10.2320/matertrans.46.2117
Plain TextMuto, Shunsuke, Enomoto, Naruaki (2005) Substructures of Gas-Ion-Irradiation-Induced Surface Blisters in Silicon Studied by Cross-Sectional Transmission Electron Microscopy. MATERIALS TRANSACTIONS, 46 (10). 2117-2124 doi:10.2320/matertrans.46.2117
In(2005) MATERIALS TRANSACTIONS Vol. 46 (10) Japan Institute of Metals

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Muto, Shunsuke, Tanabe, Tetsuo, Maruyama, Tadashi (2003) Cross Sectional TEM Observation of Gas-Ion-Irradiation Induced Surface Blisters and Their Precursors in SiC. MATERIALS TRANSACTIONS, 44 (12). 2599-2604 doi:10.2320/matertrans.44.2599
Enomoto, Naruaki, Muto, Shunsuke, Arai, Sigeo, Tanabe, Tetsuo, Haasz, Anthony A. (2005) Grazing Incidence Electron Microscopy of Deuteron-irradiation Induced Surface Blisters in Tungsten. Materia Japan, 44 (12). 1005 doi:10.2320/materia.44.1005
Igarashi, Sin, Muto, Shunsuke, Tanabe, Tetsuo, Maruyama, Tadashi (2001) Energy-Filtered Image of Surface Blisters by Grazing Incidence Electron Microscopy. MATERIALS TRANSACTIONS, 42 (10). 2131-2132 doi:10.2320/matertrans.42.2131
Nakano, Shinsuke, Enomoto, Naruaki, Muto, Shunsuke, Tanabe, Tetsuo (2004) Non-Destructive Structural Analysis and Internal Gas Pressure Estimation of Hydrogen-Irradiation-Induced Blisters on Si Surfaces. Materia Japan, 43 (12). 1008 doi:10.2320/materia.43.1008
Enomoto, Naruaki, Muto, Shunsuke, Tanabe, Tetsuo, Davis, J.W., Haasz, A.A. (2009) Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation. Journal of Nuclear Materials, 385 (3). 606-614 doi:10.1016/j.jnucmat.2009.01.298
Muto, Shunsuke, Takeda, Seiji, Hirata, Mitsuji (1995) Extended Defect Formation in Silicon and Germanium Induced by Light Gas Ion Irradiation Studied with Transmission Electron Microscopy. Materials Science Forum, 196. 1171-1176 doi:10.4028/www.scientific.net/msf.196-201.1171
Nakano, Shinsuke, Muto, Shunsuke, Tanabe, Tetsuo (2006) Change in Mechanical Properties of Ion-Irradiated Ceramics Studied by Nanoindentation. MATERIALS TRANSACTIONS, 47 (1). 112-121 doi:10.2320/matertrans.47.112
Muto, Shunsuke, Tanabe, Tetsuo (1998) Electron-Irradiation-induced Structural Change of Graphite Studied by TEM-EELS Method. Materia Japan, 37 (10). 873-879 doi:10.2320/materia.37.873
Nishijima, Masahiko, Hiraga, Kenji (2007) Structural Changes of Precipitates in an Mg-5 at%Gd Alloy Studied by Transmission Electron Microscopy. MATERIALS TRANSACTIONS, 48 (1). 10-15 doi:10.2320/matertrans.48.10
Nagase, Takeshi, Umakoshi, Yukichi (2005) Electron Irradiation Induced Nanocrystallization Behavior in Fe71Zr9B20 Metallic Glass. MATERIALS TRANSACTIONS, 46 (3). 608-615 doi:10.2320/matertrans.46.608
Nino, Akihiro, Nagase, Takeshi, Umakoshi, Yukichi (2005) Electron Irradiation Induced Nano-Crystallization in Fe77Nd4.5B18.5 Metallic Glass. MATERIALS TRANSACTIONS, 46 (8). 1814-1819 doi:10.2320/matertrans.46.1814
 
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