Kim, Sung Soo, Kim, Jong Hoon, Booh, Seong Woon, Kim, Tae-Gyu, Lee, Hyuck Mo (2005) Microstructural Evolution of Joint Interface between Eutectic 80Au–20Sn Solder and UBM. MATERIALS TRANSACTIONS, 46 (11). 2400-2405 doi:10.2320/matertrans.46.2400
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Microstructural Evolution of Joint Interface between Eutectic 80Au–20Sn Solder and UBM | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Kim, Sung Soo | Author | |
Kim, Jong Hoon | Author | ||
Booh, Seong Woon | Author | ||
Kim, Tae-Gyu | Author | ||
Lee, Hyuck Mo | Author | ||
Year | 2005 | Volume | 46 |
Issue | 11 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.46.2400Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7777846 | Long-form Identifier | mindat:1:5:7777846:2 |
GUID | 0 | ||
Full Reference | Kim, Sung Soo, Kim, Jong Hoon, Booh, Seong Woon, Kim, Tae-Gyu, Lee, Hyuck Mo (2005) Microstructural Evolution of Joint Interface between Eutectic 80Au–20Sn Solder and UBM. MATERIALS TRANSACTIONS, 46 (11). 2400-2405 doi:10.2320/matertrans.46.2400 | ||
Plain Text | Kim, Sung Soo, Kim, Jong Hoon, Booh, Seong Woon, Kim, Tae-Gyu, Lee, Hyuck Mo (2005) Microstructural Evolution of Joint Interface between Eutectic 80Au–20Sn Solder and UBM. MATERIALS TRANSACTIONS, 46 (11). 2400-2405 doi:10.2320/matertrans.46.2400 | ||
In | (2005) MATERIALS TRANSACTIONS Vol. 46 (11) Japan Institute of Metals |
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