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Nguyen, T.P., Amgaad, K., Cailler, M., Tran, V.H., Lefrant, S. (1995) XPS analysis of thermal and plasma treated polyparaphenylene-vinylene thin films and their interface formed with aluminum layer. Synthetic Metals, 69 (1). 495-496 doi:10.1016/0379-6779(94)02541-6

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Reference TypeJournal (article/letter/editorial)
TitleXPS analysis of thermal and plasma treated polyparaphenylene-vinylene thin films and their interface formed with aluminum layer
JournalSynthetic Metals
AuthorsNguyen, T.P.Author
Amgaad, K.Author
Cailler, M.Author
Tran, V.H.Author
Lefrant, S.Author
Year1995 (March)Volume69
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0379-6779(94)02541-6Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID7790429Long-form Identifiermindat:1:5:7790429:8
GUID0
Full ReferenceNguyen, T.P., Amgaad, K., Cailler, M., Tran, V.H., Lefrant, S. (1995) XPS analysis of thermal and plasma treated polyparaphenylene-vinylene thin films and their interface formed with aluminum layer. Synthetic Metals, 69 (1). 495-496 doi:10.1016/0379-6779(94)02541-6
Plain TextNguyen, T.P., Amgaad, K., Cailler, M., Tran, V.H., Lefrant, S. (1995) XPS analysis of thermal and plasma treated polyparaphenylene-vinylene thin films and their interface formed with aluminum layer. Synthetic Metals, 69 (1). 495-496 doi:10.1016/0379-6779(94)02541-6
In(1995, March) Synthetic Metals Vol. 69 (1) Elsevier BV

See Also

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Nguyen, T.P., Tran, V.H., Lefrant, S. (1995) AC properties of poly(paraphenylene-vinylene) thin films. Synthetic Metals, 69 (1). 443-444 doi:10.1016/0379-6779(94)02522-z
Nguyen, T.P., Le Rendu, P., Amgaad, K., Cailler, M., Tran, V.H. (1995) Influence of thermal and plasma treatments on the electrical properties of poly(para-phenylene vinylene)-based diodes. Synthetic Metals, 72 (1). 35-39 doi:10.1016/0379-6779(94)02312-m
Tran, V.H., Nguyen, T.P., Massardier, V., Davenas, J., Boiteux, G. (1995) Defect structures in poly(p-phenylene-vinylene. Synthetic Metals, 69 (1). 435-436 doi:10.1016/0379-6779(94)02518-4
Nguyen, T.P., Lefrant, S., Froyer, G., Pelous, Y., Ratier, B., Moliton, A. (1991) XPS and Raman characterization of ion implanted polyparaphenylene thin films. Synthetic Metals, 41 (1). 291-294 doi:10.1016/0379-6779(91)91065-i
Nguyen, T.P, Ettaik, H, Lefrant, S, Leising, G, Stelzer, F (1990) Studies of the polyparaphenylene/aluminium interface. Synthetic Metals, 38 (1). 69-76 doi:10.1016/0379-6779(90)90068-v
Le Rendu, P., Nguyen, T.P., Gaudin, O., Tran, V.H. (1996) Electrical properties of phenylene vinylene oligomer thin films. Synthetic Metals, 76 (1). 187-190 doi:10.1016/0379-6779(95)03449-t
Nguyen, T.P., Ettaik, H., Lefrant, S., Leising, G. (1991) Electrical conduction in polyparaphenylene thin films prepared from a precursor polymer. Synthetic Metals, 44 (1). 45-53 doi:10.1016/0379-6779(91)91856-6
Massardier, V., Cajipe, V.B., Nguyen, T.P., Tran, V.H. (1995) Molecular orientation in cold-stretched poly(phenylene vinylene) films. Synthetic Metals, 75 (3). 169-173 doi:10.1016/0379-6779(96)80003-8
Nguyen, T.P., Lefrant, S., Tran, V.H., Guyot, A., Molinie, P. (1992) Polarons in non-ideal conjugated systems. Synthetic Metals, 51 (1). 277-283 doi:10.1016/0379-6779(92)90281-m
Nguyen, T.P., Jonnard, P., Vergand, F., Staub, P.F., Thirion, J., Łapkowski, M., Tran, V.H. (1995) Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies. Synthetic Metals, 75 (3). 175-179 doi:10.1016/0379-6779(96)80004-x
Lefrant, S., Perrin, E., Buisson, J.P., Eckhardt, H., Han, C.C. (1989) Vibrational studies of polyparaphenylene-vinylene (PPV). Synthetic Metals, 29 (1). 91-96 doi:10.1016/0379-6779(89)90281-6
 
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