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Kawaharada, Miho, Ooishi, Mitsuma, Saito, Takeshi, Hasegawa, Etsuo (1997) Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM. Synthetic Metals, 91 (1). 113-116 doi:10.1016/s0379-6779(97)03989-1

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Reference TypeJournal (article/letter/editorial)
TitleNuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM
JournalSynthetic Metals
AuthorsKawaharada, MihoAuthor
Ooishi, MitsumaAuthor
Saito, TakeshiAuthor
Hasegawa, EtsuoAuthor
Year1997 (December)Volume91
Issue1
PublisherElsevier BV
DOIdoi:10.1016/s0379-6779(97)03989-1Search in ResearchGate
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Mindat Ref. ID7793060Long-form Identifiermindat:1:5:7793060:0
GUID0
Full ReferenceKawaharada, Miho, Ooishi, Mitsuma, Saito, Takeshi, Hasegawa, Etsuo (1997) Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM. Synthetic Metals, 91 (1). 113-116 doi:10.1016/s0379-6779(97)03989-1
Plain TextKawaharada, Miho, Ooishi, Mitsuma, Saito, Takeshi, Hasegawa, Etsuo (1997) Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM. Synthetic Metals, 91 (1). 113-116 doi:10.1016/s0379-6779(97)03989-1
In(1997, December) Synthetic Metals Vol. 91 (1) Elsevier BV

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Furukawa, Keiichi, Terasaka, Yoshihisa, Ueda, Hideaki, Matsumura, Michio (1997) Effect of a plasma treatment of ITO on the performance of organic electroluminescent devices. Synthetic Metals, 91 (1). 99-101 doi:10.1016/s0379-6779(97)03986-6
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