Reference Type | Journal (article/letter/editorial) |
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Title | Optical characterization of chemically doped thin films of poly(p-phenylene vinylene) |
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Journal | Synthetic Metals |
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Authors | Tzolov, M. | Author |
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Koch, V.P. | Author |
Bruetting, W. | Author |
Schwoerer, M. | Author |
Year | 2000 (March) | Volume | 109 |
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Issue | 1 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/s0379-6779(99)00207-6Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 7795024 | Long-form Identifier | mindat:1:5:7795024:2 |
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GUID | 0 |
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Full Reference | Tzolov, M., Koch, V.P., Bruetting, W., Schwoerer, M. (2000) Optical characterization of chemically doped thin films of poly(p-phenylene vinylene). Synthetic Metals, 109 (1). 85-89 doi:10.1016/s0379-6779(99)00207-6 |
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Plain Text | Tzolov, M., Koch, V.P., Bruetting, W., Schwoerer, M. (2000) Optical characterization of chemically doped thin films of poly(p-phenylene vinylene). Synthetic Metals, 109 (1). 85-89 doi:10.1016/s0379-6779(99)00207-6 |
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In | (2000, March) Synthetic Metals Vol. 109 (1) Elsevier BV |
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