Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Ambrosch-Draxl, C., Nakayama, A. (2003) X-ray diffraction study of anthracene under high pressure. Synthetic Metals, 137 (1). 913-914 doi:10.1016/s0379-6779(02)01030-5
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray diffraction study of anthracene under high pressure | ||
| Journal | Synthetic Metals | ||
| Authors | Oehzelt, M. | Author | |
| Resel, R. | Author | ||
| Hummer, K. | Author | ||
| Puschnig, P. | Author | ||
| Ambrosch-Draxl, C. | Author | ||
| Nakayama, A. | Author | ||
| Year | 2003 (April) | Volume | 137 |
| Issue | 1 | ||
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/s0379-6779(02)01030-5Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 7797970 | Long-form Identifier | mindat:1:5:7797970:6 |
| GUID | 0 | ||
| Full Reference | Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Ambrosch-Draxl, C., Nakayama, A. (2003) X-ray diffraction study of anthracene under high pressure. Synthetic Metals, 137 (1). 913-914 doi:10.1016/s0379-6779(02)01030-5 | ||
| Plain Text | Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Ambrosch-Draxl, C., Nakayama, A. (2003) X-ray diffraction study of anthracene under high pressure. Synthetic Metals, 137 (1). 913-914 doi:10.1016/s0379-6779(02)01030-5 | ||
| In | (2003, April) Synthetic Metals Vol. 137 (1) Elsevier BV | ||
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