Mu, R., Tung, Y. S., Ueda, A., Henderson, D. O. (1996) Chemical and Size Characterization of Layered Lead Iodide Quantum Dots via Optical Spectroscopy and Atomic Force Microscopy. The Journal of Physical Chemistry, 100 (51). 19927-19932 doi:10.1021/jp960605a
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Chemical and Size Characterization of Layered Lead Iodide Quantum Dots via Optical Spectroscopy and Atomic Force Microscopy | ||
Journal | The Journal of Physical Chemistry | ||
Authors | Mu, R. | Author | |
Tung, Y. S. | Author | ||
Ueda, A. | Author | ||
Henderson, D. O. | Author | ||
Year | 1996 (January) | Volume | 100 |
Issue | 51 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/jp960605aSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8045014 | Long-form Identifier | mindat:1:5:8045014:0 |
GUID | 0 | ||
Full Reference | Mu, R., Tung, Y. S., Ueda, A., Henderson, D. O. (1996) Chemical and Size Characterization of Layered Lead Iodide Quantum Dots via Optical Spectroscopy and Atomic Force Microscopy. The Journal of Physical Chemistry, 100 (51). 19927-19932 doi:10.1021/jp960605a | ||
Plain Text | Mu, R., Tung, Y. S., Ueda, A., Henderson, D. O. (1996) Chemical and Size Characterization of Layered Lead Iodide Quantum Dots via Optical Spectroscopy and Atomic Force Microscopy. The Journal of Physical Chemistry, 100 (51). 19927-19932 doi:10.1021/jp960605a | ||
In | (1996, January) The Journal of Physical Chemistry Vol. 100 (51) American Chemical Society (ACS) |
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