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Yoshida, Tomoko, Tanaka, Tsunehiro, Yoshida, Hisao, Funabiki, Takuzo, Yoshida, Satohiro (1996) Study on the Dispersion of Nickel Ions in the NiO−MgO System by X-ray Absorption Fine Structure. The Journal of Physical Chemistry, 100 (6). 2302-2309 doi:10.1021/jp952526p

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Reference TypeJournal (article/letter/editorial)
TitleStudy on the Dispersion of Nickel Ions in the NiO−MgO System by X-ray Absorption Fine Structure
JournalThe Journal of Physical Chemistry
AuthorsYoshida, TomokoAuthor
Tanaka, TsunehiroAuthor
Yoshida, HisaoAuthor
Funabiki, TakuzoAuthor
Yoshida, SatohiroAuthor
Year1996 (January)Volume100
Issue6
PublisherAmerican Chemical Society (ACS)
DOIdoi:10.1021/jp952526pSearch in ResearchGate
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Mindat Ref. ID8045254Long-form Identifiermindat:1:5:8045254:6
GUID0
Full ReferenceYoshida, Tomoko, Tanaka, Tsunehiro, Yoshida, Hisao, Funabiki, Takuzo, Yoshida, Satohiro (1996) Study on the Dispersion of Nickel Ions in the NiO−MgO System by X-ray Absorption Fine Structure. The Journal of Physical Chemistry, 100 (6). 2302-2309 doi:10.1021/jp952526p
Plain TextYoshida, Tomoko, Tanaka, Tsunehiro, Yoshida, Hisao, Funabiki, Takuzo, Yoshida, Satohiro (1996) Study on the Dispersion of Nickel Ions in the NiO−MgO System by X-ray Absorption Fine Structure. The Journal of Physical Chemistry, 100 (6). 2302-2309 doi:10.1021/jp952526p
In(1996, January) The Journal of Physical Chemistry Vol. 100 (6) American Chemical Society (ACS)


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