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Maity, G., Dubey, S., El-Azab, Anter, Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., Patel, Shiv P. (2020) An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC Advances, 10 (8). 4414-4426 doi:10.1039/c9ra08836a

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Reference TypeJournal (article/letter/editorial)
TitleAn assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation
JournalRSC Advances
AuthorsMaity, G.Author
Dubey, S.Author
El-Azab, AnterAuthor
Singhal, R.Author
Ojha, S.Author
Kulriya, P. K.Author
Dhar, S.Author
Som, T.Author
Kanjilal, D.Author
Patel, Shiv P.Author
Year2020Volume10
Issue8
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c9ra08836aSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID8134435Long-form Identifiermindat:1:5:8134435:0
GUID0
Full ReferenceMaity, G., Dubey, S., El-Azab, Anter, Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., Patel, Shiv P. (2020) An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC Advances, 10 (8). 4414-4426 doi:10.1039/c9ra08836a
Plain TextMaity, G., Dubey, S., El-Azab, Anter, Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., Patel, Shiv P. (2020) An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC Advances, 10 (8). 4414-4426 doi:10.1039/c9ra08836a
In(2020) RSC Advances Vol. 10 (8) Royal Society of Chemistry (RSC)

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