Kist, Steffen, Korampally, Venumadhav (2017) Re-usable PDMS stamps for non-destructive fluorescence evaluation and imaging of thin film photonic structures. The Analyst, 142 (17). 3227-3234 doi:10.1039/c7an01010a
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Re-usable PDMS stamps for non-destructive fluorescence evaluation and imaging of thin film photonic structures | ||
Journal | The Analyst | ||
Authors | Kist, Steffen | Author | |
Korampally, Venumadhav | Author | ||
Year | 2017 | Volume | 142 |
Issue | 17 | ||
Publisher | Royal Society of Chemistry (RSC) | ||
DOI | doi:10.1039/c7an01010aSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8209135 | Long-form Identifier | mindat:1:5:8209135:8 |
GUID | 0 | ||
Full Reference | Kist, Steffen, Korampally, Venumadhav (2017) Re-usable PDMS stamps for non-destructive fluorescence evaluation and imaging of thin film photonic structures. The Analyst, 142 (17). 3227-3234 doi:10.1039/c7an01010a | ||
Plain Text | Kist, Steffen, Korampally, Venumadhav (2017) Re-usable PDMS stamps for non-destructive fluorescence evaluation and imaging of thin film photonic structures. The Analyst, 142 (17). 3227-3234 doi:10.1039/c7an01010a | ||
In | (2017) The Analyst Vol. 142 (17) Royal Society of Chemistry (RSC) |
See Also
These are possibly similar items as determined by title/reference text matching only.