Häusler, Jonas, Schimmel, Saskia, Wellmann, Peter, Schnick, Wolfgang (2017) Ammonothermal Synthesis of Earth-Abundant Nitride Semiconductors ZnSiN2 and ZnGeN2 and Dissolution Monitoring by In Situ X-ray Imaging. Chemistry - A European Journal, 23 (50). 12275-12282 doi:10.1002/chem.201701081
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Ammonothermal Synthesis of Earth-Abundant Nitride Semiconductors ZnSiN2 and ZnGeN2 and Dissolution Monitoring by In Situ X-ray Imaging | ||
Journal | Chemistry - A European Journal | ||
Authors | Häusler, Jonas | Author | |
Schimmel, Saskia | Author | ||
Wellmann, Peter | Author | ||
Schnick, Wolfgang | Author | ||
Year | 2017 (September 7) | Volume | 23 |
Issue | 50 | ||
Publisher | Wiley | ||
DOI | doi:10.1002/chem.201701081Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8271330 | Long-form Identifier | mindat:1:5:8271330:8 |
GUID | 0 | ||
Full Reference | Häusler, Jonas, Schimmel, Saskia, Wellmann, Peter, Schnick, Wolfgang (2017) Ammonothermal Synthesis of Earth-Abundant Nitride Semiconductors ZnSiN2 and ZnGeN2 and Dissolution Monitoring by In Situ X-ray Imaging. Chemistry - A European Journal, 23 (50). 12275-12282 doi:10.1002/chem.201701081 | ||
Plain Text | Häusler, Jonas, Schimmel, Saskia, Wellmann, Peter, Schnick, Wolfgang (2017) Ammonothermal Synthesis of Earth-Abundant Nitride Semiconductors ZnSiN2 and ZnGeN2 and Dissolution Monitoring by In Situ X-ray Imaging. Chemistry - A European Journal, 23 (50). 12275-12282 doi:10.1002/chem.201701081 | ||
In | (2017, September) Chemistry - A European Journal Vol. 23 (50) Wiley |
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