| Reference Type | Journal (article/letter/editorial) |
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| Title | X-ray diffuse scattering on the first type defects in semiconductors |
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| Journal | Acta Crystallographica Section A Foundations of Crystallography |
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| Authors | Shalimov, A. | Author |
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| Shcherbachev, K. | Author |
| Bak-Misiuk, J. | Author |
| Year | 2005 (August 23) | Volume | 61 |
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| Publisher | International Union of Crystallography (IUCr) |
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| DOI | doi:10.1107/s0108767305081092Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 8441452 | Long-form Identifier | mindat:1:5:8441452:6 |
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|
| GUID | 0 |
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| Full Reference | Shalimov, A., Shcherbachev, K., Bak-Misiuk, J. (2005) X-ray diffuse scattering on the first type defects in semiconductors. Acta Crystallographica Section A Foundations of Crystallography, 61. doi:10.1107/s0108767305081092 |
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| Plain Text | Shalimov, A., Shcherbachev, K., Bak-Misiuk, J. (2005) X-ray diffuse scattering on the first type defects in semiconductors. Acta Crystallographica Section A Foundations of Crystallography, 61. doi:10.1107/s0108767305081092 |
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| In | (n.d.) Acta Crystallographica Section A Foundations of Crystallography Vol. 61. International Union of Crystallography (IUCr) |
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