Ratinen, H. (1972) Study of Film Thickness in rf Sputtering. Applied Physics Letters, 20 (12). 477-478 doi:10.1063/1.1654023
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Study of Film Thickness in rf Sputtering | ||
Journal | Applied Physics Letters | ||
Authors | Ratinen, H. | Author | |
Year | 1972 (June 15) | Volume | 20 |
Issue | 12 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1654023Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8456106 | Long-form Identifier | mindat:1:5:8456106:4 |
GUID | 0 | ||
Full Reference | Ratinen, H. (1972) Study of Film Thickness in rf Sputtering. Applied Physics Letters, 20 (12). 477-478 doi:10.1063/1.1654023 | ||
Plain Text | Ratinen, H. (1972) Study of Film Thickness in rf Sputtering. Applied Physics Letters, 20 (12). 477-478 doi:10.1063/1.1654023 | ||
In | (1972, June) Applied Physics Letters Vol. 20 (12) AIP Publishing |
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