Swanson, M. L., Wichert, Th., Quenneville, A. F. (1986) Detection of In‐P and In‐Sb atom pairs by perturbed angular correlation in silicon. Applied Physics Letters, 49 (5). 265-267 doi:10.1063/1.97136
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Detection of In‐P and In‐Sb atom pairs by perturbed angular correlation in silicon | ||
Journal | Applied Physics Letters | ||
Authors | Swanson, M. L. | Author | |
Wichert, Th. | Author | ||
Quenneville, A. F. | Author | ||
Year | 1986 (August 4) | Volume | 49 |
Issue | 5 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.97136Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8479216 | Long-form Identifier | mindat:1:5:8479216:9 |
GUID | 0 | ||
Full Reference | Swanson, M. L., Wichert, Th., Quenneville, A. F. (1986) Detection of In‐P and In‐Sb atom pairs by perturbed angular correlation in silicon. Applied Physics Letters, 49 (5). 265-267 doi:10.1063/1.97136 | ||
Plain Text | Swanson, M. L., Wichert, Th., Quenneville, A. F. (1986) Detection of In‐P and In‐Sb atom pairs by perturbed angular correlation in silicon. Applied Physics Letters, 49 (5). 265-267 doi:10.1063/1.97136 | ||
In | (1986, August) Applied Physics Letters Vol. 49 (5) AIP Publishing |
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