Muralt, P., Meier, H., Pohl, D. W., Salemink, H. W. M. (1987) Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction. Applied Physics Letters, 50 (19). 1352-1354 doi:10.1063/1.97853
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction | ||
Journal | Applied Physics Letters | ||
Authors | Muralt, P. | Author | |
Meier, H. | Author | ||
Pohl, D. W. | Author | ||
Salemink, H. W. M. | Author | ||
Year | 1987 (May 11) | Volume | 50 |
Issue | 19 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.97853Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8479996 | Long-form Identifier | mindat:1:5:8479996:8 |
GUID | 0 | ||
Full Reference | Muralt, P., Meier, H., Pohl, D. W., Salemink, H. W. M. (1987) Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction. Applied Physics Letters, 50 (19). 1352-1354 doi:10.1063/1.97853 | ||
Plain Text | Muralt, P., Meier, H., Pohl, D. W., Salemink, H. W. M. (1987) Scanning tunneling microscopy and potentiometry on a semiconductor heterojunction. Applied Physics Letters, 50 (19). 1352-1354 doi:10.1063/1.97853 | ||
In | (1987, May) Applied Physics Letters Vol. 50 (19) AIP Publishing |
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