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Vacínová, J., Hodeau, J. L., Wolfers, P., Lauriat, J. P., ElKaim, E. (1995) Use of Anomalous Diffraction, DAFS and DANES Techniques for Site-Selective Spectroscopy of Complex Oxides. Journal of Synchrotron Radiation, 2 (5). 236-244 doi:10.1107/s0909049595007886

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Reference TypeJournal (article/letter/editorial)
TitleUse of Anomalous Diffraction, DAFS and DANES Techniques for Site-Selective Spectroscopy of Complex Oxides
JournalJournal of Synchrotron Radiation
AuthorsVacínová, J.Author
Hodeau, J. L.Author
Wolfers, P.Author
Lauriat, J. P.Author
ElKaim, E.Author
Year1995 (September 1)Volume2
Issue5
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049595007886Search in ResearchGate
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Mindat Ref. ID8481800Long-form Identifiermindat:1:5:8481800:5
GUID0
Full ReferenceVacínová, J., Hodeau, J. L., Wolfers, P., Lauriat, J. P., ElKaim, E. (1995) Use of Anomalous Diffraction, DAFS and DANES Techniques for Site-Selective Spectroscopy of Complex Oxides. Journal of Synchrotron Radiation, 2 (5). 236-244 doi:10.1107/s0909049595007886
Plain TextVacínová, J., Hodeau, J. L., Wolfers, P., Lauriat, J. P., ElKaim, E. (1995) Use of Anomalous Diffraction, DAFS and DANES Techniques for Site-Selective Spectroscopy of Complex Oxides. Journal of Synchrotron Radiation, 2 (5). 236-244 doi:10.1107/s0909049595007886
In(1995, September) Journal of Synchrotron Radiation Vol. 2 (5) International Union of Crystallography (IUCr)

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Hodeau, J. L., Vacínová, J., Garreau, Y., Fontaine, A., Hagelstein, M., Elkaïm, E., Lauriat, J. P., Prat, A., Wolfers, P. (1995) Diffraction anomalous fine structure measurements by using an energy/angular ‘‘dispersive diffraction’’ experimental setup. Review of Scientific Instruments, 66 (2). 1499-1501 doi:10.1063/1.1145954
Vacínová, J., Hodeau, J.L., Wolfers, P., ElKaïm, E., Lauriat, J.P., Bouchet-Fabre, B., Chamberland, B.L. (1995) Anomalous scattering and DAFS measurements of small single crystal of barium platinum oxide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 97 (1). 102-106 doi:10.1016/0168-583x(94)00384-x
Hodeau, J.L., Vacínová, J., Wolfers, P., Garreau, Y., Fontaine, A., Hagelstein, M., Elkaïm, E., Lauriat, J.P., Collomb, A., Muller, J. (1995) Site selectivity of DAFS analysis on hexaferrite at Fe K edge by using both monochromatic optics and energy dispersive optics. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 97 (1). 115-118 doi:10.1016/0168-583x(94)00365-3
Ravel, B., Bouldin, C. E., Renevier, H., Hodeau, J.-L., Berar, J.-F. (1999) Edge separation using diffraction anomalous fine structure. Journal of Synchrotron Radiation, 6 (3). 338-340 doi:10.1107/s0909049598013648
Renevier, H., Joly, Y., García, J., Subías, G., Proietti, M. G., Hodeau, J. L., Blasco, J. (2001) Diffraction anomalous fine structure of forbidden Bragg reflections: charge localization and structure of the octahedral site in magnetite. Journal of Synchrotron Radiation, 8 (2). 390-392 doi:10.1107/s090904950100036x
Hodeau, J. L., Vacinova, J., Renevier, H., Wolfers, P., Berar, J. F., Hagelstein, M., San Miguel, A. (1996) Diffraction anomalous fine structure at the ESRF by using dispersive and monochromatic diffraction. Acta Crystallographica Section A Foundations of Crystallography, 52. doi:10.1107/s0108767396098054
Cross, J. O., Elam, W. T., Harris, V. G., Kirkland, J. P., Bouldin, C. E., Sorensen, L. B. (1998) Sample-angle feedback for diffraction anomalous fine-structure spectroscopy. Journal of Synchrotron Radiation, 5 (3). 911-913 doi:10.1107/s0909049597014313
Renevier, H., Grenier, S., Arnaud, S., Bérar, J. F., Caillot, B., Hodeau, J. L., Letoublon, A., Proietti, M. G., Ravel, B. (2003) Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility. Journal of Synchrotron Radiation, 10 (6). 435-444 doi:10.1107/s0909049503021332
Proietti, M. G., Renevier, H., Hodeau, J. L., García, J., Bérar, J. F., Wolfers, P. (1999) Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors. Physical Review B, 59 (8) 5479-5492 doi:10.1103/physrevb.59.5479
Renevier, H., Hodeau, J. L., Dalakas, V., Wolfers, P., Bérar, J. F., Andrieu, S., Weigelt, J., Frahm, R. (1997) Application of DAFS Spectroscopy to Study the Variations of Fe local structure in a Fe/Ir(100) Superlattice. Le Journal de Physique IV, 7. doi:10.1051/jp4:1997223
Fanchon, E., Vicat, J., Hodeau, J. L., Lévy, J. P., Wolfers, P. (1987) Cation ordering, domains and conductivity in some hollandite ionic conductors. Acta Crystallographica Section A Foundations of Crystallography, 43. doi:10.1107/s0108767387081996
 
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