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Hwang, C.-S., Fan, T. C., Lin, F. Y., Yeh, Shuting, Chang, C. H., Chen, H. H., Tseng, P. K. (1998) Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Journal of Synchrotron Radiation, 5 (3). 471-474 doi:10.1107/s0909049597013691

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Reference TypeJournal (article/letter/editorial)
TitleAdvanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator
JournalJournal of Synchrotron Radiation
AuthorsHwang, C.-S.Author
Fan, T. C.Author
Lin, F. Y.Author
Yeh, ShutingAuthor
Chang, C. H.Author
Chen, H. H.Author
Tseng, P. K.Author
Year1998 (May 1)Volume5
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049597013691Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8482151Long-form Identifiermindat:1:5:8482151:3
GUID0
Full ReferenceHwang, C.-S., Fan, T. C., Lin, F. Y., Yeh, Shuting, Chang, C. H., Chen, H. H., Tseng, P. K. (1998) Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Journal of Synchrotron Radiation, 5 (3). 471-474 doi:10.1107/s0909049597013691
Plain TextHwang, C.-S., Fan, T. C., Lin, F. Y., Yeh, Shuting, Chang, C. H., Chen, H. H., Tseng, P. K. (1998) Advanced field-measurement method with three orthogonal Hall probes for an elliptically polarizing undulator. Journal of Synchrotron Radiation, 5 (3). 471-474 doi:10.1107/s0909049597013691
In(1998, May) Journal of Synchrotron Radiation Vol. 5 (3) International Union of Crystallography (IUCr)


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