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Wei, S., Oyanagi, H., Kawanami, H., Sakamoto, K., Sakamoto, T., Saini, N. L. (1999) Local structures of dilute impurities in Si crystal studied by fluorescence XAFS. Journal of Synchrotron Radiation, 6 (3). 573-575 doi:10.1107/s0909049598016665

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Reference TypeJournal (article/letter/editorial)
TitleLocal structures of dilute impurities in Si crystal studied by fluorescence XAFS
JournalJournal of Synchrotron Radiation
AuthorsWei, S.Author
Oyanagi, H.Author
Kawanami, H.Author
Sakamoto, K.Author
Sakamoto, T.Author
Saini, N. L.Author
Year1999 (May 1)Volume6
Issue3
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049598016665Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8483004Long-form Identifiermindat:1:5:8483004:3
GUID0
Full ReferenceWei, S., Oyanagi, H., Kawanami, H., Sakamoto, K., Sakamoto, T., Saini, N. L. (1999) Local structures of dilute impurities in Si crystal studied by fluorescence XAFS. Journal of Synchrotron Radiation, 6 (3). 573-575 doi:10.1107/s0909049598016665
Plain TextWei, S., Oyanagi, H., Kawanami, H., Sakamoto, K., Sakamoto, T., Saini, N. L. (1999) Local structures of dilute impurities in Si crystal studied by fluorescence XAFS. Journal of Synchrotron Radiation, 6 (3). 573-575 doi:10.1107/s0909049598016665
In(1999, May) Journal of Synchrotron Radiation Vol. 6 (3) International Union of Crystallography (IUCr)

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Wei, S., Oyanagi, H., Sakamoto, K., Takeda, Y., Pearsall, T. P. (1999) Local structures of (Ge4/Si4)5monolayer strained-layer supperlattice probed by fluorescence XAFS. Journal of Synchrotron Radiation, 6 (3). 790-792 doi:10.1107/s0909049598017853
Wei, Shiqiang, Oyanagi, Hiroyuki, Kawanami, Hitoshi, Sakamoto, Kunihiro, Sakamoto, Tsunenori, Tamura, Kazuhisa, Saini, Naurang L., Uosaki, Kohei (1997) Local structures of isovalent and heterovalent dilute impurities in Si crystal probed by fluorescence x-ray absorption fine structure. Journal of Applied Physics, 82 (10). 4810-4815 doi:10.1063/1.366340
Wen, C., Yasue, K., Wei, S., Hu, T., Oyanagi, H. (1999) XAFS and XRD studies on local and long-range structures of mechanically alloyed AlxTi1−xsolid solutions. Journal of Synchrotron Radiation, 6 (3). 725-727 doi:10.1107/s0909049598018123
Oyanagi, H., Ishii, M., Lee, C., Saini, N. L., Kuwahara, Y., Saito, A., Izumi, Y., Hashimoto, H. (1999) Rapid and sensitive XAFS using a tunable X-ray undulator. Journal of Synchrotron Radiation, 6 (3). 155-157 doi:10.1107/s0909049598017245
Wu, Z., Guo, L., Ju, X., Li, Q., Zhu, H. (1999) Local atomic structures of hematite nanoparticles studied with XAFS. Journal of Synchrotron Radiation, 6 (3). 749-751 doi:10.1107/s0909049598017051
Saini, N. L., Lanzara, A., Natali, F., Bianconi, A., Akoshima, M., Koike, Y., Oyanagi, H. (1999) Local structure andTcsuppression in Bi2Sr2Ca1−xYx(Cu1−yZny)2O8+δsuperconductor at 1/8 doping. Journal of Synchrotron Radiation, 6 (3). 752-754 doi:10.1107/s0909049599001508
Li, Z., Jiang, M., Bian, G., Fu, Y., Wei, S. (1999) Effect of rhodium modification on structures of sulfided Rh–Mo–K/Al2O3catalysts studied by XAFS. Journal of Synchrotron Radiation, 6 (3). 462-464 doi:10.1107/s0909049598017890
Oyanagi, Hiroyuki, Sakamoto, Kunihiro, Sakamoto, Tsunenori (1993) Heterointerfaces in Strained-Layer Superlattices Studied by Surface-Sensitive XAFS. Japanese Journal of Applied Physics, 32. 119 doi:10.7567/jjaps.32s1.119
Ishii, M., Komuro, S., Morikawa, T., Aoyagi, Y., Oyanagi, H., Ishikawa, T., Ueki, T. (1999) The optically active center of Er-doped Si produced by laser ablation. Journal of Synchrotron Radiation, 6 (3). 477-479 doi:10.1107/s0909049599000898
Miyanaga, T., Hoshino, H., Endo, H., Sakane, H. (1999) XAFS study of silver clusters in zeolites. Journal of Synchrotron Radiation, 6 (3). 442-444 doi:10.1107/s0909049599000631
Yoshida, T., Yoshida, H., Hara, T., Sakai, M., Omori, A., Tanabe, T. (1999) XAFS study on D+irradiated Si surface. Journal of Synchrotron Radiation, 6 (3). 734-736 doi:10.1107/s0909049598018196
 
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