Clark, S. M., Jeanloz, R. (2005) A new paradigm to extend diffraction measurements beyond the megabar regime. Journal of Synchrotron Radiation, 12 (5). 632-636 doi:10.1107/s0909049505021084
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A new paradigm to extend diffraction measurements beyond the megabar regime | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Clark, S. M. | Author | |
Jeanloz, R. | Author | ||
Year | 2005 (September 1) | Volume | 12 |
Issue | 5 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0909049505021084Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8485242 | Long-form Identifier | mindat:1:5:8485242:5 |
GUID | 0 | ||
Full Reference | Clark, S. M., Jeanloz, R. (2005) A new paradigm to extend diffraction measurements beyond the megabar regime. Journal of Synchrotron Radiation, 12 (5). 632-636 doi:10.1107/s0909049505021084 | ||
Plain Text | Clark, S. M., Jeanloz, R. (2005) A new paradigm to extend diffraction measurements beyond the megabar regime. Journal of Synchrotron Radiation, 12 (5). 632-636 doi:10.1107/s0909049505021084 | ||
In | (2005, September) Journal of Synchrotron Radiation Vol. 12 (5) International Union of Crystallography (IUCr) |
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