Bunk, Oliver, Pfeiffer, Franz, Stampanoni, Marco, Patterson, Bruce D., Schulze-Briese, Clemens, David, Christian (2005) X-ray beam-position monitoring in the sub-micrometre and sub-second regime. Journal of Synchrotron Radiation, 12 (6). 795-799 doi:10.1107/s0909049505028189
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | X-ray beam-position monitoring in the sub-micrometre and sub-second regime | ||
| Journal | Journal of Synchrotron Radiation | ||
| Authors | Bunk, Oliver | Author | |
| Pfeiffer, Franz | Author | ||
| Stampanoni, Marco | Author | ||
| Patterson, Bruce D. | Author | ||
| Schulze-Briese, Clemens | Author | ||
| David, Christian | Author | ||
| Year | 2005 (November 1) | Volume | 12 |
| Issue | 6 | ||
| Publisher | International Union of Crystallography (IUCr) | ||
| DOI | doi:10.1107/s0909049505028189Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8485310 | Long-form Identifier | mindat:1:5:8485310:5 |
| GUID | 0 | ||
| Full Reference | Bunk, Oliver, Pfeiffer, Franz, Stampanoni, Marco, Patterson, Bruce D., Schulze-Briese, Clemens, David, Christian (2005) X-ray beam-position monitoring in the sub-micrometre and sub-second regime. Journal of Synchrotron Radiation, 12 (6). 795-799 doi:10.1107/s0909049505028189 | ||
| Plain Text | Bunk, Oliver, Pfeiffer, Franz, Stampanoni, Marco, Patterson, Bruce D., Schulze-Briese, Clemens, David, Christian (2005) X-ray beam-position monitoring in the sub-micrometre and sub-second regime. Journal of Synchrotron Radiation, 12 (6). 795-799 doi:10.1107/s0909049505028189 | ||
| In | (2005, November) Journal of Synchrotron Radiation Vol. 12 (6) International Union of Crystallography (IUCr) | ||
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