Kyele, Nicholas R., Decanniere, Klaas, van Silfhout, Roelof G. (2005) A transparent two-dimensionalin situbeam-position and profile monitor for synchrotron X-ray beamlines. Journal of Synchrotron Radiation, 12 (6). 800-806 doi:10.1107/s0909049505031250
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | A transparent two-dimensionalin situbeam-position and profile monitor for synchrotron X-ray beamlines | ||
| Journal | Journal of Synchrotron Radiation | ||
| Authors | Kyele, Nicholas R. | Author | |
| Decanniere, Klaas | Author | ||
| van Silfhout, Roelof G. | Author | ||
| Year | 2005 (November 1) | Volume | 12 |
| Issue | 6 | ||
| Publisher | International Union of Crystallography (IUCr) | ||
| DOI | doi:10.1107/s0909049505031250Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8485319 | Long-form Identifier | mindat:1:5:8485319:6 |
| GUID | 0 | ||
| Full Reference | Kyele, Nicholas R., Decanniere, Klaas, van Silfhout, Roelof G. (2005) A transparent two-dimensionalin situbeam-position and profile monitor for synchrotron X-ray beamlines. Journal of Synchrotron Radiation, 12 (6). 800-806 doi:10.1107/s0909049505031250 | ||
| Plain Text | Kyele, Nicholas R., Decanniere, Klaas, van Silfhout, Roelof G. (2005) A transparent two-dimensionalin situbeam-position and profile monitor for synchrotron X-ray beamlines. Journal of Synchrotron Radiation, 12 (6). 800-806 doi:10.1107/s0909049505031250 | ||
| In | (2005, November) Journal of Synchrotron Radiation Vol. 12 (6) International Union of Crystallography (IUCr) | ||
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