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Floriot, Johan, Levecq, Xavier, Bucourt, Samuel, Thomasset, Muriel, Polack, François, Idir, Mourad, Mercère, Pascal, Moreno, Thierry, Brochet, Sylvain (2008) A Shack–Hartmann measuring head for the two-dimensional characterization of X-ray mirrors. Journal of Synchrotron Radiation, 15 (2). 134-139 doi:10.1107/s0909049507066083

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Reference TypeJournal (article/letter/editorial)
TitleA Shack–Hartmann measuring head for the two-dimensional characterization of X-ray mirrors
JournalJournal of Synchrotron Radiation
AuthorsFloriot, JohanAuthor
Levecq, XavierAuthor
Bucourt, SamuelAuthor
Thomasset, MurielAuthor
Polack, FrançoisAuthor
Idir, MouradAuthor
Mercère, PascalAuthor
Moreno, ThierryAuthor
Brochet, SylvainAuthor
Year2008 (March 1)Volume15
Issue2
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049507066083Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8485710Long-form Identifiermindat:1:5:8485710:1
GUID0
Full ReferenceFloriot, Johan, Levecq, Xavier, Bucourt, Samuel, Thomasset, Muriel, Polack, François, Idir, Mourad, Mercère, Pascal, Moreno, Thierry, Brochet, Sylvain (2008) A Shack–Hartmann measuring head for the two-dimensional characterization of X-ray mirrors. Journal of Synchrotron Radiation, 15 (2). 134-139 doi:10.1107/s0909049507066083
Plain TextFloriot, Johan, Levecq, Xavier, Bucourt, Samuel, Thomasset, Muriel, Polack, François, Idir, Mourad, Mercère, Pascal, Moreno, Thierry, Brochet, Sylvain (2008) A Shack–Hartmann measuring head for the two-dimensional characterization of X-ray mirrors. Journal of Synchrotron Radiation, 15 (2). 134-139 doi:10.1107/s0909049507066083
In(2008, March) Journal of Synchrotron Radiation Vol. 15 (2) International Union of Crystallography (IUCr)

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Thomasset, Muriel, Moreno, Thierry, Capitanio, Blandine, Idir, Mourad, Bucourt, Samuel (2010) In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 616 (2). 197-202 doi:10.1016/j.nima.2009.12.034
Idir, Mourad, Mercere, Pascal, Modi, Mohammed H., Dovillaire, Guillaume, Levecq, Xavier, Bucourt, Samuel, Escolano, Lionel, Sauvageot, Paul (2010) X-ray active mirror coupled with a Hartmann wavefront sensor. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 616 (2). 162-171 doi:10.1016/j.nima.2009.10.168
Huang, Lei, Xue, Junpeng, Idir, Mourad (2016) Controlling X-ray deformable mirrors during inspection. Journal of Synchrotron Radiation, 23 (6). 1348-1356 doi:10.1107/s1600577516014600
Polack, François, Thomasset, Muriel, Brochet, Sylvain, Rommeveaux, Amparo (2010) An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 616 (2). 207-211 doi:10.1016/j.nima.2009.10.166
Thomasset, Muriel, Idir, Mourad, Polack, François, Bray, Michael, Servant, Jean-Jacques (2013) A new phase-shift microscope designed for high accuracy stitching interferometry. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 710. 7-12 doi:10.1016/j.nima.2012.10.123
Thomasset, M., Dvorak, J., Brochet, S., Dennetiere, D., Polack, F. (2019) Grating metrology for X-ray and V-UV synchrotron beamlines at SOLEIL. Review of Scientific Instruments, 90 (2). 21714pp. doi:10.1063/1.5055284
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