Hahn, F., Melendres, C. A. (2010) Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper. Journal of Synchrotron Radiation, 17 (1). 81-85 doi:10.1107/s0909049509040680
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Hahn, F. | Author | |
Melendres, C. A. | Author | ||
Year | 2010 (January 1) | Volume | 17 |
Issue | 1 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0909049509040680Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8486194 | Long-form Identifier | mindat:1:5:8486194:6 |
GUID | 0 | ||
Full Reference | Hahn, F., Melendres, C. A. (2010) Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper. Journal of Synchrotron Radiation, 17 (1). 81-85 doi:10.1107/s0909049509040680 | ||
Plain Text | Hahn, F., Melendres, C. A. (2010) Synchrotron infrared reflectance microspectroscopy study of film formation and breakdown on copper. Journal of Synchrotron Radiation, 17 (1). 81-85 doi:10.1107/s0909049509040680 | ||
In | (2010, January) Journal of Synchrotron Radiation Vol. 17 (1) International Union of Crystallography (IUCr) |
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