du Plessis, Hester Esna, de Villiers, J. P. R., Kruger, G. J., Steuwer, A., Brunelli, M. (2011) Rietveld and pair distribution function study of Hägg carbide using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (2). 266-271 doi:10.1107/s0909049510048958
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Rietveld and pair distribution function study of Hägg carbide using synchrotron X-ray diffraction | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | du Plessis, Hester Esna | Author | |
de Villiers, J. P. R. | Author | ||
Kruger, G. J. | Author | ||
Steuwer, A. | Author | ||
Brunelli, M. | Author | ||
Year | 2011 (March 1) | Volume | 18 |
Issue | 2 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s0909049510048958Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8486511 | Long-form Identifier | mindat:1:5:8486511:9 |
GUID | 0 | ||
Full Reference | du Plessis, Hester Esna, de Villiers, J. P. R., Kruger, G. J., Steuwer, A., Brunelli, M. (2011) Rietveld and pair distribution function study of Hägg carbide using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (2). 266-271 doi:10.1107/s0909049510048958 | ||
Plain Text | du Plessis, Hester Esna, de Villiers, J. P. R., Kruger, G. J., Steuwer, A., Brunelli, M. (2011) Rietveld and pair distribution function study of Hägg carbide using synchrotron X-ray diffraction. Journal of Synchrotron Radiation, 18 (2). 266-271 doi:10.1107/s0909049510048958 | ||
In | (2011, March) Journal of Synchrotron Radiation Vol. 18 (2) International Union of Crystallography (IUCr) |
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