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Tian, J. S., Han, G. M., Wei, H., Jin, T., Dargusch, M. S. (2012) Local structure of NiAl compounds investigated by extended X-ray absorption fine-structure spectroscopy. Journal of Synchrotron Radiation, 19 (4). 503-507 doi:10.1107/s0909049512015646

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Reference TypeJournal (article/letter/editorial)
TitleLocal structure of NiAl compounds investigated by extended X-ray absorption fine-structure spectroscopy
JournalJournal of Synchrotron Radiation
AuthorsTian, J. S.Author
Han, G. M.Author
Wei, H.Author
Jin, T.Author
Dargusch, M. S.Author
Year2012 (July 1)Volume19
Issue4
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s0909049512015646Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8486899Long-form Identifiermindat:1:5:8486899:4
GUID0
Full ReferenceTian, J. S., Han, G. M., Wei, H., Jin, T., Dargusch, M. S. (2012) Local structure of NiAl compounds investigated by extended X-ray absorption fine-structure spectroscopy. Journal of Synchrotron Radiation, 19 (4). 503-507 doi:10.1107/s0909049512015646
Plain TextTian, J. S., Han, G. M., Wei, H., Jin, T., Dargusch, M. S. (2012) Local structure of NiAl compounds investigated by extended X-ray absorption fine-structure spectroscopy. Journal of Synchrotron Radiation, 19 (4). 503-507 doi:10.1107/s0909049512015646
In(2012, July) Journal of Synchrotron Radiation Vol. 19 (4) International Union of Crystallography (IUCr)

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