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Xu, Weihe, Lauer, Kenneth, Chu, Yong, Nazaretski, Evgeny (2014) A high-precision instrument for mapping of rotational errors in rotary stages. Journal of Synchrotron Radiation, 21 (6). 1367-1369 doi:10.1107/s160057751401618x

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Reference TypeJournal (article/letter/editorial)
TitleA high-precision instrument for mapping of rotational errors in rotary stages
JournalJournal of Synchrotron Radiation
AuthorsXu, WeiheAuthor
Lauer, KennethAuthor
Chu, YongAuthor
Nazaretski, EvgenyAuthor
Year2014 (November 1)Volume21
Issue6
PublisherInternational Union of Crystallography (IUCr)
DOIdoi:10.1107/s160057751401618xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID8487740Long-form Identifiermindat:1:5:8487740:6
GUID0
Full ReferenceXu, Weihe, Lauer, Kenneth, Chu, Yong, Nazaretski, Evgeny (2014) A high-precision instrument for mapping of rotational errors in rotary stages. Journal of Synchrotron Radiation, 21 (6). 1367-1369 doi:10.1107/s160057751401618x
Plain TextXu, Weihe, Lauer, Kenneth, Chu, Yong, Nazaretski, Evgeny (2014) A high-precision instrument for mapping of rotational errors in rotary stages. Journal of Synchrotron Radiation, 21 (6). 1367-1369 doi:10.1107/s160057751401618x
In(2014, November) Journal of Synchrotron Radiation Vol. 21 (6) International Union of Crystallography (IUCr)

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