Clausen, E. M., Craighead, H. G., Worlock, J. M., Harbison, J. P., Schiavone, L. M., Florez, L., Van der Gaag, B. (1989) Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs. Applied Physics Letters, 55 (14). 1427-1429 doi:10.1063/1.101614
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs | ||
Journal | Applied Physics Letters | ||
Authors | Clausen, E. M. | Author | |
Craighead, H. G. | Author | ||
Worlock, J. M. | Author | ||
Harbison, J. P. | Author | ||
Schiavone, L. M. | Author | ||
Florez, L. | Author | ||
Van der Gaag, B. | Author | ||
Year | 1989 (October 2) | Volume | 55 |
Issue | 14 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.101614Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8488055 | Long-form Identifier | mindat:1:5:8488055:2 |
GUID | 0 | ||
Full Reference | Clausen, E. M., Craighead, H. G., Worlock, J. M., Harbison, J. P., Schiavone, L. M., Florez, L., Van der Gaag, B. (1989) Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs. Applied Physics Letters, 55 (14). 1427-1429 doi:10.1063/1.101614 | ||
Plain Text | Clausen, E. M., Craighead, H. G., Worlock, J. M., Harbison, J. P., Schiavone, L. M., Florez, L., Van der Gaag, B. (1989) Determination of nonradiative surface layer thickness in quantum dots etched from single quantum well GaAs/AlGaAs. Applied Physics Letters, 55 (14). 1427-1429 doi:10.1063/1.101614 | ||
In | (1989, October) Applied Physics Letters Vol. 55 (14) AIP Publishing |
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