Reference Type | Journal (article/letter/editorial) |
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Title | Optical study of residual strains in CdTe and ZnTe layers grown by molecular beam epitaxy on GaAs |
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Journal | Applied Physics Letters |
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Authors | Dang, Le Si | Author |
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Cibert, J. | Author |
Gobil, Y. | Author |
Saminadayar, K. | Author |
Tatarenko, S. | Author |
Year | 1989 (July 17) | Volume | 55 |
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Issue | 3 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.101917Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8489027 | Long-form Identifier | mindat:1:5:8489027:6 |
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|
GUID | 0 |
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Full Reference | Dang, Le Si, Cibert, J., Gobil, Y., Saminadayar, K., Tatarenko, S. (1989) Optical study of residual strains in CdTe and ZnTe layers grown by molecular beam epitaxy on GaAs. Applied Physics Letters, 55 (3). 235-237 doi:10.1063/1.101917 |
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Plain Text | Dang, Le Si, Cibert, J., Gobil, Y., Saminadayar, K., Tatarenko, S. (1989) Optical study of residual strains in CdTe and ZnTe layers grown by molecular beam epitaxy on GaAs. Applied Physics Letters, 55 (3). 235-237 doi:10.1063/1.101917 |
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In | (1989, July) Applied Physics Letters Vol. 55 (3) AIP Publishing |
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