Jark, Werner (2020) A high-efficiency and high-spectral-resolution EUV/soft X-ray monochromator based on off-plane diffraction. Journal of Synchrotron Radiation, 27 (1). 25-30 doi:10.1107/s1600577519014462
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | A high-efficiency and high-spectral-resolution EUV/soft X-ray monochromator based on off-plane diffraction | ||
Journal | Journal of Synchrotron Radiation | ||
Authors | Jark, Werner | Author | |
Year | 2020 (January 1) | Volume | 27 |
Issue | 1 | ||
Publisher | International Union of Crystallography (IUCr) | ||
DOI | doi:10.1107/s1600577519014462Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8489944 | Long-form Identifier | mindat:1:5:8489944:4 |
GUID | 0 | ||
Full Reference | Jark, Werner (2020) A high-efficiency and high-spectral-resolution EUV/soft X-ray monochromator based on off-plane diffraction. Journal of Synchrotron Radiation, 27 (1). 25-30 doi:10.1107/s1600577519014462 | ||
Plain Text | Jark, Werner (2020) A high-efficiency and high-spectral-resolution EUV/soft X-ray monochromator based on off-plane diffraction. Journal of Synchrotron Radiation, 27 (1). 25-30 doi:10.1107/s1600577519014462 | ||
In | (2020, January) Journal of Synchrotron Radiation Vol. 27 (1) International Union of Crystallography (IUCr) |
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