Ni, W.‐X., Henry, A., Larsson, M. I., Joelsson, K., Hansson, G. V. (1994) High quality Si/Si1−xGexlayered structures grown using a mass‐spectrometry controlled electron‐beam evaporation system. Applied Physics Letters, 65 (14). 1772-1774 doi:10.1063/1.112913
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | High quality Si/Si1−xGexlayered structures grown using a mass‐spectrometry controlled electron‐beam evaporation system | ||
Journal | Applied Physics Letters | ||
Authors | Ni, W.‐X. | Author | |
Henry, A. | Author | ||
Larsson, M. I. | Author | ||
Joelsson, K. | Author | ||
Hansson, G. V. | Author | ||
Year | 1994 (October 3) | Volume | 65 |
Issue | 14 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.112913Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8509783 | Long-form Identifier | mindat:1:5:8509783:0 |
GUID | 0 | ||
Full Reference | Ni, W.‐X., Henry, A., Larsson, M. I., Joelsson, K., Hansson, G. V. (1994) High quality Si/Si1−xGexlayered structures grown using a mass‐spectrometry controlled electron‐beam evaporation system. Applied Physics Letters, 65 (14). 1772-1774 doi:10.1063/1.112913 | ||
Plain Text | Ni, W.‐X., Henry, A., Larsson, M. I., Joelsson, K., Hansson, G. V. (1994) High quality Si/Si1−xGexlayered structures grown using a mass‐spectrometry controlled electron‐beam evaporation system. Applied Physics Letters, 65 (14). 1772-1774 doi:10.1063/1.112913 | ||
In | (1994, October) Applied Physics Letters Vol. 65 (14) AIP Publishing |
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