Hata, K., Ishida, M., Miyake, K., Shigekawa, H. (1998) Surface dynamics studied by perturbing the surface with the tip of a scanning tunneling microscope—Si(100) at 80 K. Applied Physics Letters, 73 (1). 40-42 doi:10.1063/1.121716
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Surface dynamics studied by perturbing the surface with the tip of a scanning tunneling microscope—Si(100) at 80 K | ||
| Journal | Applied Physics Letters | ||
| Authors | Hata, K. | Author | |
| Ishida, M. | Author | ||
| Miyake, K. | Author | ||
| Shigekawa, H. | Author | ||
| Year | 1998 (July 6) | Volume | 73 |
| Issue | 1 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.121716Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8521711 | Long-form Identifier | mindat:1:5:8521711:5 |
| GUID | 0 | ||
| Full Reference | Hata, K., Ishida, M., Miyake, K., Shigekawa, H. (1998) Surface dynamics studied by perturbing the surface with the tip of a scanning tunneling microscope—Si(100) at 80 K. Applied Physics Letters, 73 (1). 40-42 doi:10.1063/1.121716 | ||
| Plain Text | Hata, K., Ishida, M., Miyake, K., Shigekawa, H. (1998) Surface dynamics studied by perturbing the surface with the tip of a scanning tunneling microscope—Si(100) at 80 K. Applied Physics Letters, 73 (1). 40-42 doi:10.1063/1.121716 | ||
| In | (1998, July) Applied Physics Letters Vol. 73 (1) AIP Publishing | ||
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