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Hamann, H. F., Gallagher, A., Nesbitt, D. J. (1998) Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution. Applied Physics Letters, 73 (11). 1469-1471 doi:10.1063/1.122176

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Reference TypeJournal (article/letter/editorial)
TitleEnhanced sensitivity near-field scanning optical microscopy at high spatial resolution
JournalApplied Physics Letters
AuthorsHamann, H. F.Author
Gallagher, A.Author
Nesbitt, D. J.Author
Year1998 (September 14)Volume73
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.122176Search in ResearchGate
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Mindat Ref. ID8521796Long-form Identifiermindat:1:5:8521796:6
GUID0
Full ReferenceHamann, H. F., Gallagher, A., Nesbitt, D. J. (1998) Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution. Applied Physics Letters, 73 (11). 1469-1471 doi:10.1063/1.122176
Plain TextHamann, H. F., Gallagher, A., Nesbitt, D. J. (1998) Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution. Applied Physics Letters, 73 (11). 1469-1471 doi:10.1063/1.122176
In(1998, September) Applied Physics Letters Vol. 73 (11) AIP Publishing

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