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Liu, Jian, Barnard, John C., Seeger, Katrin, Palmer, Richard E. (1998) Microfabrication of nanoscale cluster chains on a patterned Si surface. Applied Physics Letters, 73 (14). 2030-2032 doi:10.1063/1.122358

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Reference TypeJournal (article/letter/editorial)
TitleMicrofabrication of nanoscale cluster chains on a patterned Si surface
JournalApplied Physics Letters
AuthorsLiu, JianAuthor
Barnard, John C.Author
Seeger, KatrinAuthor
Palmer, Richard E.Author
Year1998 (October 5)Volume73
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.122358Search in ResearchGate
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Mindat Ref. ID8521978Long-form Identifiermindat:1:5:8521978:8
GUID0
Full ReferenceLiu, Jian, Barnard, John C., Seeger, Katrin, Palmer, Richard E. (1998) Microfabrication of nanoscale cluster chains on a patterned Si surface. Applied Physics Letters, 73 (14). 2030-2032 doi:10.1063/1.122358
Plain TextLiu, Jian, Barnard, John C., Seeger, Katrin, Palmer, Richard E. (1998) Microfabrication of nanoscale cluster chains on a patterned Si surface. Applied Physics Letters, 73 (14). 2030-2032 doi:10.1063/1.122358
In(1998, October) Applied Physics Letters Vol. 73 (14) AIP Publishing

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Tada, Tetsuya, Kanayama, Toshihiko, Koga, Kenji, Weibel, Pascal, Carroll, Simon J, Seeger, Katrin, Palmer, Richard E (1998) Formation of 10 nm Si structures using size-selected metal clusters. Journal of Physics D: Applied Physics, 31. doi:10.1088/0022-3727/31/7/001
Carroll, S. J., Seeger, K., Palmer, R. E. (1998) Trapping of size-selected Ag clusters at surface steps. Applied Physics Letters, 72 (3). 305-307 doi:10.1063/1.120719
Hunt, Michael R. C., Schmidt, Jens, Palmer, Richard E. (1998) Electron-beam damage of C60 films on hydrogen-passivated Si(100). Applied Physics Letters, 72 (3). 323-325 doi:10.1063/1.120725
Wilkerson, Charles W., Goodwin, Peter M., Ambrose, W. Patrick, Martin, John C., Keller, Richard A. (1993) Detection and lifetime measurement of single molecules in flowing sample streams by laser‐induced fluorescence. Applied Physics Letters, 62 (17). 2030-2032 doi:10.1063/1.109495
Marsal, L., Mariette, H., Samson, Y., Rouvière, J. L., Picard, E. (1998) Nanoscale surface clustering on CdTe epilayers. Applied Physics Letters, 73 (20). 2974-2976 doi:10.1063/1.122648
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Magnano, E (2003) Cluster beam microfabrication of SiC pattern on Si(1 0 0). Surface Science, 544 (2). doi:10.1016/j.susc.2003.08.008
(2009) Catalyst patterned growth of interconnecting graphene layer on SiO2/Si substrate for integrated devices. Applied Physics Letters, 95 (14). 143102pp. doi:10.1063/1.3240403
Poweleit, C. D., Gunther, A., Goodnick, S., Menéndez, José (1998) Raman imaging of patterned silicon using a solid immersion lens. Applied Physics Letters, 73 (16). 2275-2277 doi:10.1063/1.121700
Lee, S. C., Brueck, S. R. J. (2009) Scaling of the surface migration length in nanoscale patterned growth. Applied Physics Letters, 94 (15). 153110pp. doi:10.1063/1.3117366
Kimura, Yoshinobu, Nakagawa, Kiyokazu, Miyao, Masanobu (1998) The effect of surface segregation on the light-emission intensity of Si/SiGe/Si heterostructures. Applied Physics Letters, 73 (2). 232-234 doi:10.1063/1.121765
 
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