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Zhang, Z., Hammel, P. C., Midzor, M., Roukes, M. L., Childress, J. R. (1998) Ferromagnetic resonance force microscopy on microscopic cobalt single layer films. Applied Physics Letters, 73 (14). 2036-2038 doi:10.1063/1.122359

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Reference TypeJournal (article/letter/editorial)
TitleFerromagnetic resonance force microscopy on microscopic cobalt single layer films
JournalApplied Physics Letters
AuthorsZhang, Z.Author
Hammel, P. C.Author
Midzor, M.Author
Roukes, M. L.Author
Childress, J. R.Author
Year1998 (October 5)Volume73
Issue14
PublisherAIP Publishing
DOIdoi:10.1063/1.122359Search in ResearchGate
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Mindat Ref. ID8521979Long-form Identifiermindat:1:5:8521979:7
GUID0
Full ReferenceZhang, Z., Hammel, P. C., Midzor, M., Roukes, M. L., Childress, J. R. (1998) Ferromagnetic resonance force microscopy on microscopic cobalt single layer films. Applied Physics Letters, 73 (14). 2036-2038 doi:10.1063/1.122359
Plain TextZhang, Z., Hammel, P. C., Midzor, M., Roukes, M. L., Childress, J. R. (1998) Ferromagnetic resonance force microscopy on microscopic cobalt single layer films. Applied Physics Letters, 73 (14). 2036-2038 doi:10.1063/1.122359
In(1998, October) Applied Physics Letters Vol. 73 (14) AIP Publishing

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Zhang, Z., Hammel, P. C., Wigen, P. E. (1996) Observation of ferromagnetic resonance in a microscopic sample using magnetic resonance force microscopy. Applied Physics Letters, 68 (14). 2005-2007 doi:10.1063/1.115619
Midzor, M. M., Wigen, P. E., Pelekhov, D., Chen, W., Hammel, P. C., Roukes, M. L. (2000) Imaging mechanisms of force detected FMR microscopy. Journal of Applied Physics, 87 (9). 6493-6495 doi:10.1063/1.372748
Zhang, Z., Roukes, M. L., Hammel, P. C. (1996) Sensitivity and spatial resolution for electron‐spin‐resonance detection by magnetic resonance force microscopy. Journal of Applied Physics, 80 (12). 6931-6938 doi:10.1063/1.363767
Urban, R., Putilin, A., Wigen, P. E., Liou, S.-H., Cross, M. C., Hammel, P. C., Roukes, M. L. (2006) Perturbation of magnetostatic modes observed by ferromagnetic resonance force microscopy. Physical Review B, 73 (21) doi:10.1103/physrevb.73.212410
Hammel, P. C., Zhang, Z., Moore, G. J., Roukes, M. L. (1995) Sub-surface imaging with the magnetic resonance force microscope. Journal of Low Temperature Physics, 101. 59-69 doi:10.1007/bf00754562
Nazaretski, E., Obukhov, Yu., Martin, I, Pelekhov, D. V., Cha, K. C., Akhadov, E. A., Hammel, P. C., Movshovich, R. (2009) Localized ferromagnetic resonance force microscopy in Permalloy-cobalt films. Journal of Applied Physics, 106 (4). 46103pp. doi:10.1063/1.3204029
Nazaretski, E., Martin, I., Movshovich, R., Pelekhov, D. V., Hammel, P. C., Zalalutdinov, M., Baldwin, J. W., Houston, B., Mewes, T. (2007) Ferromagnetic resonance force microscopy on a thin permalloy film. Applied Physics Letters, 90 (23). 234105pp. doi:10.1063/1.2747171
Page, M. R., McCullian, B. A., Purser, C. M., Schulze, J. G., Nakatani, T. M., Wolfe, C. S., Childress, J. R., McConney, M. E., Howe, B. M., Hammel, P. C., Bhallamudi, V. P. (2019) Optically detected ferromagnetic resonance in diverse ferromagnets via nitrogen vacancy centers in diamond. Journal of Applied Physics, 126 (12). 124902pp. doi:10.1063/1.5083991
White, S. P., Hammel, P. C. (2016) Ferromagnetic Resonance Force Microscopy: Spectroscopy on the Nano-Scale. Microscopy and Microanalysis, 22. 1688-1689 doi:10.1017/s1431927616009284
Sutcu, L. F., Thompson, M. S., Chu, C. J., Hauge, R. H., Margrave, J. L., D’Evelyn, M. P. (1992) Nanometer‐scale morphology of homoepitaxial diamond films by atomic force microscopy. Applied Physics Letters, 60 (14). 1685-1687 doi:10.1063/1.107237
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