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Tersoff, J., Tu, Yuhai, Grinstein, G. (1998) Effect of curvature and stress on reaction rates at solid interfaces. Applied Physics Letters, 73 (16). 2328-2330 doi:10.1063/1.121812

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Reference TypeJournal (article/letter/editorial)
TitleEffect of curvature and stress on reaction rates at solid interfaces
JournalApplied Physics Letters
AuthorsTersoff, J.Author
Tu, YuhaiAuthor
Grinstein, G.Author
Year1998 (October 19)Volume73
Issue16
PublisherAIP Publishing
DOIdoi:10.1063/1.121812Search in ResearchGate
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Mindat Ref. ID8522087Long-form Identifiermindat:1:5:8522087:2
GUID0
Full ReferenceTersoff, J., Tu, Yuhai, Grinstein, G. (1998) Effect of curvature and stress on reaction rates at solid interfaces. Applied Physics Letters, 73 (16). 2328-2330 doi:10.1063/1.121812
Plain TextTersoff, J., Tu, Yuhai, Grinstein, G. (1998) Effect of curvature and stress on reaction rates at solid interfaces. Applied Physics Letters, 73 (16). 2328-2330 doi:10.1063/1.121812
In(1998, October) Applied Physics Letters Vol. 73 (16) AIP Publishing

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Grinstein, G., Tu, Yuhai, Tersoff, J. (1998) Stability of Solid State Reaction Fronts. Physical Review Letters, 81 (12). 2490-2493 doi:10.1103/physrevlett.81.2490
Grinstein, G., Tu, Yuhai, Tersoff, J. (1999) Grinsteinet al.Reply:. Physical Review Letters, 83 (3). 657 doi:10.1103/physrevlett.83.657
Tu, Yuhai, Tersoff, J., Grinstein, G., Vanderbilt, David (1998) Properties of a Continuous-Random-Network Model for Amorphous Systems. Physical Review Letters, 81 (22). 4899-4902 doi:10.1103/physrevlett.81.4899
Tu, Yuhai, Tersoff, J. (2002) Microscopic Dynamics of Silicon Oxidation. Physical Review Letters, 89 (8). doi:10.1103/physrevlett.89.086102
Tu, Yuhai, Tersoff, J. (2000) Structure and Energetics of the Si-SiO2Interface. Physical Review Letters, 84 (19). 4393-4396 doi:10.1103/physrevlett.84.4393
Léonard, François, Tersoff, J. (2003) Competing step instabilities at surfaces under stress. Applied Physics Letters, 83 (1). 72-74 doi:10.1063/1.1591060
Tu, Yuhai, Tersoff, J. (2007) Coarsening, Mixing, and Motion: The Complex Evolution of Epitaxial Islands. Physical Review Letters, 98 (9). doi:10.1103/physrevlett.98.096103
Datskos, Panos G., Rajic, Slobodan, Datskou, Irene (1998) Photoinduced and thermal stress in silicon microcantilevers. Applied Physics Letters, 73 (16). 2319-2321 doi:10.1063/1.121809
Tu, Yuhai, Tersoff, J. (2004) Origin of Apparent Critical Thickness for Island Formation in Heteroepitaxy. Physical Review Letters, 93 (21). doi:10.1103/physrevlett.93.216101
Tseng, H.-C., Chang, C. Y., Pan, F. M., Chen, J. R., Chen, L. J. (1997) Effects of isolation materials on facet formation for silicon selective epitaxial growth. Applied Physics Letters, 71 (16). 2328-2330 doi:10.1063/1.120033
Tu, Yuhai, Grinstein, G. (2005) How White Noise Generates Power-Law Switching in Bacterial Flagellar Motors. Physical Review Letters, 94 (20). doi:10.1103/physrevlett.94.208101
 
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