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Bachelot, R., Wurtz, G., Royer, P. (1998) An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation. Applied Physics Letters, 73 (23). 3333-3335 doi:10.1063/1.122760

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Reference TypeJournal (article/letter/editorial)
TitleAn application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation
JournalApplied Physics Letters
AuthorsBachelot, R.Author
Wurtz, G.Author
Royer, P.Author
Year1998 (December 7)Volume73
Issue23
PublisherAIP Publishing
DOIdoi:10.1063/1.122760Search in ResearchGate
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Mindat Ref. ID8522457Long-form Identifiermindat:1:5:8522457:7
GUID0
Full ReferenceBachelot, R., Wurtz, G., Royer, P. (1998) An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation. Applied Physics Letters, 73 (23). 3333-3335 doi:10.1063/1.122760
Plain TextBachelot, R., Wurtz, G., Royer, P. (1998) An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation. Applied Physics Letters, 73 (23). 3333-3335 doi:10.1063/1.122760
In(1998, December) Applied Physics Letters Vol. 73 (23) AIP Publishing

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Bachelot, R., Wurtz, G., Royer, P. (1999) Erratum: “An application of the apertureless scanning near-field optical microscopy: Imaging a GaAlAs laser diode in operation” [Appl. Phys. Lett.73, 3333 (1998)]. Applied Physics Letters, 74 (9). 1347 doi:10.1063/1.123547
Wurtz, G., Bachelot, R., Royer, P. (1999) Imaging a GaAlAs laser diode in operation using apertureless scanning near-field optical microscopy. The European Physical Journal Applied Physics, 5 (3). 269-275 doi:10.1051/epjap:1999139
Wurtz, G., Bachelot, R., Royer, P. (1998) A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope. Review of Scientific Instruments, 69 (4). 1735-1743 doi:10.1063/1.1148834
Hubert, Charles, Levy, Jeremy (1998) Nanometer-scale imaging of domains in ferroelectric thin films using apertureless near-field scanning optical microscopy. Applied Physics Letters, 73 (22). 3229-3231 doi:10.1063/1.122727
Billot, L., Lamy de la Chapelle, M., Barchiesi, D., Chang, S.-H., Gray, S. K., Rogers, J. A., Bouhelier, A., Adam, P.-M., Bijeon, J.-L., Wiederrecht, G. P., Bachelot, R., Royer, P. (2006) Error signal artifact in apertureless scanning near-field optical microscopy. Applied Physics Letters, 89 (2). 23105pp. doi:10.1063/1.2219134
Bachelot, R., Gleyzes, P., Boccara, A. C. (1997) Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip. Applied Optics, 36. 2160pp. doi:10.1364/ao.36.002160
Blaize, S., Aubert, S., Bruyant, A., Bachelot, R., Lerondel, G., Royer, P., Broquin, J.-E., Minier, V. (2003) Apertureless scanning near-field optical microscopy for ion exchange channel waveguide characterization. Journal of Microscopy, 209 (3). 155-161 doi:10.1046/j.1365-2818.2003.01106.x
Billot, L., Lamy de la Chapelle, M., Barchiesi, D., Chang, S.-H., Gray, S. K., Rogers, J. A., Bouhelier, A., Adam, P.-M., Bijeon, J.-L., Wiederrecht, G. P., Bachelot, R., Royer, P. (2006) Erratum: “Error signal artifact in apertureless scanning near-field optical microscopy” [Appl. Phys. Lett. 89, 023105 (2006)]. Applied Physics Letters, 89 (9). 99901pp. doi:10.1063/1.2338883
Bergossi, O., Bachelot, R., Wioland, H., Wurtz, G., Laddada, R., Adam, P.M., Bijeon, J.L., Royer, P. (1998) Near Field Optical Microscopy and Spectroscopy with STM and AFM Probes. Acta Physica Polonica A, 93 (2). 393-398 doi:10.12693/aphyspola.93.393
H’dhili, Fekhra, Bachelot, Renaud, Lerondel, Gilles, Barchiesi, Dominique, Royer, Pascal (2001) Near-field optics: Direct observation of the field enhancement below an apertureless probe using a photosensitive polymer. Applied Physics Letters, 79 (24). 4019-4021 doi:10.1063/1.1425083
Bachelot, Renaud, Lerondel, Gilles, Blaize, Sylvain, Aubert, Sebastien, Bruyant, Aurelien, Royer, Pascal (2004) Probing photonic and optoelectronic structures by Apertureless Scanning Near-Field Optical Microscopy. Microscopy Research and Technique, 64 (5). 441-452 doi:10.1002/jemt.20102
 
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