Reference Type | Journal (article/letter/editorial) |
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Title | Failure resistance of amorphous silicon transistors under extreme in-plane strain |
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Journal | Applied Physics Letters |
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Authors | Gleskova, H. | Author |
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Wagner, S. | Author |
Suo, Z. | Author |
Year | 1999 (November 8) | Volume | 75 |
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Issue | 19 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.125174Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8524863 | Long-form Identifier | mindat:1:5:8524863:8 |
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GUID | 0 |
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Full Reference | Gleskova, H., Wagner, S., Suo, Z. (1999) Failure resistance of amorphous silicon transistors under extreme in-plane strain. Applied Physics Letters, 75 (19). 3011-3013 doi:10.1063/1.125174 |
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Plain Text | Gleskova, H., Wagner, S., Suo, Z. (1999) Failure resistance of amorphous silicon transistors under extreme in-plane strain. Applied Physics Letters, 75 (19). 3011-3013 doi:10.1063/1.125174 |
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In | (1999, November) Applied Physics Letters Vol. 75 (19) AIP Publishing |
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