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Sthal, F., Bourquin, R. (2000) Characterizing mechanical resonators by means of a scanning acoustic force microscope. Applied Physics Letters, 77 (12). 1792pp. doi:10.1063/1.1311317

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Reference TypeJournal (article/letter/editorial)
TitleCharacterizing mechanical resonators by means of a scanning acoustic force microscope
JournalApplied Physics Letters
AuthorsSthal, F.Author
Bourquin, R.Author
Year2000Volume77
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.1311317Search in ResearchGate
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Mindat Ref. ID8527170Long-form Identifiermindat:1:5:8527170:6
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Full ReferenceSthal, F., Bourquin, R. (2000) Characterizing mechanical resonators by means of a scanning acoustic force microscope. Applied Physics Letters, 77 (12). 1792pp. doi:10.1063/1.1311317
Plain TextSthal, F., Bourquin, R. (2000) Characterizing mechanical resonators by means of a scanning acoustic force microscope. Applied Physics Letters, 77 (12). 1792pp. doi:10.1063/1.1311317
In(2000) Applied Physics Letters Vol. 77 (12) AIP Publishing

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Sthal, F., Devel, M., Imbaud, J., Bourquin, R., Cibiel, G. (2015) Fluctuation-dissipation theorem and 1/f noise of bulk acoustic wave cavities. Applied Physics Letters, 107 (10). 103502pp. doi:10.1063/1.4930167
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San Paulo, A., Liu, X., Bokor, J. (2005) Scanning acoustic force microscopy characterization of thermal expansion effects on the electromechanical properties of film bulk acoustic resonators. Applied Physics Letters, 86 (8). 84102pp. doi:10.1063/1.1866508
Erbe, A., Krömmer, H., Kraus, A., Blick, R. H., Corso, G., Richter, K. (2000) Mechanical mixing in nonlinear nanomechanical resonators. Applied Physics Letters, 77 (19). 3102-3104 doi:10.1063/1.1324721
Todd, Brian A., Eppell, Steven J., Zypman, Fredy R. (2000) Improved analysis of the time domain response of scanning force microscope cantilevers. Journal of Applied Physics, 88 (12). 7321-7327 doi:10.1063/1.1322069
 
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