Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., de Korte, P. A. J. (2000) Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Applied Physics Letters, 77 (26). 4422-4424 doi:10.1063/1.1336550
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer | ||
Journal | Applied Physics Letters | ||
Authors | Hoevers, H. F. C. | Author | |
Bento, A. C. | Author | ||
Bruijn, M. P. | Author | ||
Gottardi, L. | Author | ||
Korevaar, M. A. N. | Author | ||
Mels, W. A. | Author | ||
de Korte, P. A. J. | Author | ||
Year | 2000 (December 25) | Volume | 77 |
Issue | 26 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1336550Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8528044 | Long-form Identifier | mindat:1:5:8528044:9 |
GUID | 0 | ||
Full Reference | Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., de Korte, P. A. J. (2000) Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Applied Physics Letters, 77 (26). 4422-4424 doi:10.1063/1.1336550 | ||
Plain Text | Hoevers, H. F. C., Bento, A. C., Bruijn, M. P., Gottardi, L., Korevaar, M. A. N., Mels, W. A., de Korte, P. A. J. (2000) Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Applied Physics Letters, 77 (26). 4422-4424 doi:10.1063/1.1336550 | ||
In | (2000, December) Applied Physics Letters Vol. 77 (26) AIP Publishing |
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