Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R., Caine, Ernie, Hu, Evelyn, Fernandez, Partricia (2000) Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens. Applied Physics Letters, 77 (3). 313-315 doi:10.1063/1.126961
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens | ||
| Journal | Applied Physics Letters | ||
| Authors | Li, Youli | Author | |
| Wong, Gerard C. L. | Author | ||
| Case, Ryan | Author | ||
| Safinya, Cyrus R. | Author | ||
| Caine, Ernie | Author | ||
| Hu, Evelyn | Author | ||
| Fernandez, Partricia | Author | ||
| Year | 2000 (July 17) | Volume | 77 |
| Issue | 3 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.126961Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 8528049 | Long-form Identifier | mindat:1:5:8528049:4 |
| GUID | 0 | ||
| Full Reference | Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R., Caine, Ernie, Hu, Evelyn, Fernandez, Partricia (2000) Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens. Applied Physics Letters, 77 (3). 313-315 doi:10.1063/1.126961 | ||
| Plain Text | Li, Youli, Wong, Gerard C. L., Case, Ryan, Safinya, Cyrus R., Caine, Ernie, Hu, Evelyn, Fernandez, Partricia (2000) Characterizing the hard x-ray diffraction properties of a GaAs linear Bragg–Fresnel lens. Applied Physics Letters, 77 (3). 313-315 doi:10.1063/1.126961 | ||
| In | (2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing | ||
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