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Park, Sang Il, Cho, Tae Sik, Doh, Seok Joo, Lee, Jong Lam, Je, Jung Ho (2000) Structural evolution of ZnO/sapphire(001) heteroepitaxy studied by real time synchrotron x-ray scattering. Applied Physics Letters, 77 (3). 349-351 doi:10.1063/1.126972

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Reference TypeJournal (article/letter/editorial)
TitleStructural evolution of ZnO/sapphire(001) heteroepitaxy studied by real time synchrotron x-ray scattering
JournalApplied Physics Letters
AuthorsPark, Sang IlAuthor
Cho, Tae SikAuthor
Doh, Seok JooAuthor
Lee, Jong LamAuthor
Je, Jung HoAuthor
Year2000 (July 17)Volume77
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.126972Search in ResearchGate
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Mindat Ref. ID8528061Long-form Identifiermindat:1:5:8528061:6
GUID0
Full ReferencePark, Sang Il, Cho, Tae Sik, Doh, Seok Joo, Lee, Jong Lam, Je, Jung Ho (2000) Structural evolution of ZnO/sapphire(001) heteroepitaxy studied by real time synchrotron x-ray scattering. Applied Physics Letters, 77 (3). 349-351 doi:10.1063/1.126972
Plain TextPark, Sang Il, Cho, Tae Sik, Doh, Seok Joo, Lee, Jong Lam, Je, Jung Ho (2000) Structural evolution of ZnO/sapphire(001) heteroepitaxy studied by real time synchrotron x-ray scattering. Applied Physics Letters, 77 (3). 349-351 doi:10.1063/1.126972
In(2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing

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Cho, Tae Sik, Doh, Seok Joo, Je, Jung Ho, Noh, Do Young (1999) Iron-Oxide Interlayer Existing in Ba-Ferrite/Sapphire(001) Films Grown by Sputtering. Japanese Journal of Applied Physics, 38. 444 doi:10.7567/jjaps.38s1.444
Cho, Tae Sik, Yi, Min Su, Doh, Seok Joo, Je, Jung Ho, Noh, Do Young (2004) Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques. physica status solidi (b), 241 (7). 1748-1751 doi:10.1002/pssb.200304518
Doh, Seok Joo, Choi, Seung Dueg, Je, Jung Ho, Cho, Tae Sik (2002) Inhibition of abnormal acicular grain growth of nanostructured Ba–ferrite films by secondary α-Fe[sub 2]O[sub 3] phase. Journal of Applied Physics, 91 (10). 7869pp. doi:10.1063/1.1451307
Kang, Tae Soo, Je, Jung Ho (2002) Real-time x-ray scattering study on the thermal evolution of interface roughness in CoSi2 formation. Applied Physics Letters, 80 (8). 1361-1363 doi:10.1063/1.1455149
Chang, Hyo Sik, Hwang, Hyunsang, Cho, Mann-Ho, Moon, Dae Won, Doh, Seok Joo, Lee, Jong Ho, Lee, Nae-In (2004) Thermal stability and decomposition of the HfO2–Al2O3 laminate system. Applied Physics Letters, 84 (1). 28-30 doi:10.1063/1.1637955
Kim, Sang Sub, Hishita, Shunichi, Cho, Tae Sik, Je, Jung Ho (2000) Graphitization of ultrathin amorphous carbon films on Si(001) by Ar+ ion irradiation at ambient temperature. Journal of Applied Physics, 88 (1). 55-58 doi:10.1063/1.373623
Joo Doh, Seok, Ho Je, Jung, Sik Cho, Tae (2002) Role of interfacial crystallites in the crystallization of α-Fe2O3/α-Al2O3(0001) thin films. Journal of Crystal Growth, 240 (3). 355-362 doi:10.1016/s0022-0248(02)00908-9
Hur, Tae-Bong, Hwang, Yoon-Hwae, Kim, Hyung-Kook, Park, Hong-Lee (2004) Study of the structural evolution in ZnO thin film by in situ synchrotron x-ray scattering. Journal of Applied Physics, 96 (3). 1740-1742 doi:10.1063/1.1762706
Cho, Tae Sik, Je, Jung Ho, Noh, Do Young (2000) Formation of crystalline Ba-ferrite phase from α-Fe2O3 phase in amorphous precursor. Applied Physics Letters, 76 (3). 303-305 doi:10.1063/1.125727
Kim, Sang Sub, Kang, Tae Soo, Je, Jung Ho (2001) Structural evolution of epitaxial SrRuO3 thin films grown on SrTiO3(001). Journal of Applied Physics, 90 (9). 4407-4410 doi:10.1063/1.1405135
Weon, Byung Mook, Kim, Soo Young, Lee, Jong-Lam, Je, Jung Ho (2006) Evolution of luminance by voltage in organic light-emitting diodes. Applied Physics Letters, 88 (1). 13503pp. doi:10.1063/1.2159563
 
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