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Brückner, W., Baunack, S., Hecker, M., Mönch, J.-I., van Loyen, L., Schneider, C. M. (2000) Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices. Applied Physics Letters, 77 (3). 358-360 doi:10.1063/1.126975

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Reference TypeJournal (article/letter/editorial)
TitleInterdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices
JournalApplied Physics Letters
AuthorsBrückner, W.Author
Baunack, S.Author
Hecker, M.Author
Mönch, J.-I.Author
van Loyen, L.Author
Schneider, C. M.Author
Year2000 (July 17)Volume77
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.126975Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8528064Long-form Identifiermindat:1:5:8528064:3
GUID0
Full ReferenceBrückner, W., Baunack, S., Hecker, M., Mönch, J.-I., van Loyen, L., Schneider, C. M. (2000) Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices. Applied Physics Letters, 77 (3). 358-360 doi:10.1063/1.126975
Plain TextBrückner, W., Baunack, S., Hecker, M., Mönch, J.-I., van Loyen, L., Schneider, C. M. (2000) Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices. Applied Physics Letters, 77 (3). 358-360 doi:10.1063/1.126975
In(2000, July) Applied Physics Letters Vol. 77 (3) AIP Publishing

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Brückner, W., Baunack, S., Hecker, M., Monch, J.-I., van Loyen, L., Schneider, C. M. (2000) Erratum: “Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices” [Appl. Phys. Lett. 77, 358 (2000)]. Applied Physics Letters, 77 (7). 1064pp. doi:10.1063/1.1290446
Brückner, W., Baunack, S., Thomas, J., Hecker, M., Schneider, C. M. (2002) Interdiffusion, stress, and microstructure evolution during annealing in Co/Cu/Co trilayers. Journal of Applied Physics, 91 (12). 9696pp. doi:10.1063/1.1479750
Hecker, M., Tietjen, D., Schneider, C. M., Cramer, N., Malkinski, L., Camley, R. E., Celinski, Z. (2002) Thermal stability and degradation mechanism of NiFe/Cu giant magnetoresistance multilayer systems. Journal of Applied Physics, 91 (10). 7203pp. doi:10.1063/1.1452201
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Dubois, S., Marchal, C., Beuken, J. M., Piraux, L., Duvail, J. L., Fert, A., George, J. M., Maurice, J. L. (1997) Perpendicular giant magnetoresistance of NiFe/Cu multilayered nanowires. Applied Physics Letters, 70 (3). 396-398 doi:10.1063/1.118385
Chang, L. J., Lin, Pang, Lee, S. F. (2012) Current induced localized domain wall oscillators in NiFe/Cu/NiFe submicron wires. Applied Physics Letters, 101 (24). 242404pp. doi:10.1063/1.4770306
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