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Alvarez, Tony, Kalinin, Sergei V., Bonnell, Dawn A. (2001) Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction. Applied Physics Letters, 78 (7). 1005-1007 doi:10.1063/1.1345818

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Reference TypeJournal (article/letter/editorial)
TitleMagnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction
JournalApplied Physics Letters
AuthorsAlvarez, TonyAuthor
Kalinin, Sergei V.Author
Bonnell, Dawn A.Author
Year2001 (February 12)Volume78
Issue7
PublisherAIP Publishing
DOIdoi:10.1063/1.1345818Search in ResearchGate
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Mindat Ref. ID8529650Long-form Identifiermindat:1:5:8529650:1
GUID0
Full ReferenceAlvarez, Tony, Kalinin, Sergei V., Bonnell, Dawn A. (2001) Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction. Applied Physics Letters, 78 (7). 1005-1007 doi:10.1063/1.1345818
Plain TextAlvarez, Tony, Kalinin, Sergei V., Bonnell, Dawn A. (2001) Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction. Applied Physics Letters, 78 (7). 1005-1007 doi:10.1063/1.1345818
In(2001, February) Applied Physics Letters Vol. 78 (7) AIP Publishing

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